EVAL-ADXL350Z Analog Devices, EVAL-ADXL350Z Datasheet - Page 31

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EVAL-ADXL350Z

Manufacturer Part Number
EVAL-ADXL350Z
Description
Acceleration Sensor Development Tools EB
Manufacturer
Analog Devices
Datasheet

Specifications of EVAL-ADXL350Z

Rohs
yes
Interface Type
I2C, SPI
Maximum Operating Temperature
+ 85 C
Minimum Operating Temperature
- 40 C
Product
Evaluation Boards
Factory Pack Quantity
1
Data Sheet
With the stored values for self-test enabled and disabled, the
self-test change is as follows:
Because the measured output for each axis is expressed in LSBs,
X
converted to g’s of acceleration by multiplying each value by the
2 mg/LSB scale factor, if configured for full-resolution, 8 g mode.
Additionally, Table 13 through Table 16 correspond to the self-
test range converted to LSBs and can be compared with the
measured self-test change. If the part was placed into full-
resolution, 8 g mode, the values listed in Table 13 should be used.
ST
, Y
X
Y
Z
ST
ST
ST
ST
, and Z
= Y
= Z
= X
ST_ON
ST_ON
ST_ON
ST
are also expressed in LSBs. These values can be
− Z
− Y
− X
ST_OFF
ST_OFF
ST_OFF
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Although the fixed 10-bit mode or a range other than 8 g can be
used, a different set of values, as indicated in Table 14 through
Table 16, would need to be used. Using a range below 8 g may
result in insufficient dynamic range and should be considered
when selecting the range of operation for measuring self-test. In
addition, note that the range in Table 1 and the values in Table 13
through Table 16 take into account all possible supply voltages, V
and no additional conversion due to V
If the self-test change is within the valid range, the test is considered
successful. Generally, a part is considered to pass if the minimum
magnitude of change is achieved. However, a part that changes
by more than the maximum magnitude is not necessarily a failure.
S
is necessary.
ADXL350
S
,

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