TC58DVG02A1FT Toshiba, TC58DVG02A1FT Datasheet - Page 42

• Manufacturer Part Number: TC58DVG02A1FT
• Description: IC FLASH 1GBIT 50NS 48TSOP
• Manufacturer: Toshiba

Specifications of TC58DVG02A1FT

• Format - Memory: FLASH
• Memory Type: FLASH - Nand
• Memory Size: 1G (128M x 8)
• Speed: 50ns
• Interface: Serial
• Voltage - Supply: 2.7 V ~ 3.6 V
• Operating Temperature: 0°C ~ 70°C
• Package / Case: 48-TSOP
• Lead Free Status / RoHS Status: Contains lead / RoHS non-compliant

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Bad Block Test Flow
Invalid blocks (bad blocks)
do not use these bad blocks.
The device contains unusable blocks. Therefore, at the time of use, please check whether a block is bad and
Figure 26.
Block No.
* 1: No erase operation is allowed to detected bad blocks
Block No.
Bad Block
Bad Block
No
1
Block, all bytes are not in the FFH state. Please don’t perform erase
operation to Bad Block.
Figure 27 shows the test flow for bad block detection. Bad blocks which are
detected by the test flow must be managed as unusable blocks by the
system.
isolated from the Bit line by the Select gate
Valid (Good) Block Number
At the time of shipment, all data bytes in a Valid Block are FFH. For Bad
Check if the device has any bad blocks after installation into the system.
A bad block does not affect the performance of good blocks because it is
The number of valid blocks at the time of shipment is as follows:
Block No.
Block No
Read Check
Figure 27
Start
End
Pass
Yes
8192
1
Fail
8032
MIN
Read Check: to verify the column address of
Bad Block * 1
TYP.
TC58DVG02A1FT00
517bytes of the first page in the
block with FF (Hex)
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MAX
8192
Block
UNIT