TLP2601 Toshiba, TLP2601 Datasheet - Page 64

• Manufacturer Part Number: TLP2601
• Description: PHOTOCOUPLER HS LOGIC OUT 8-DIP
• Manufacturer: Toshiba

Specifications of TLP2601

• Voltage - Isolation: 2500Vrms
• Number Of Channels: 1, Unidirectional
• Current - Output / Channel: 25mA
• Data Rate: 10MBd
• Propagation Delay High - Low @ If: 60ns @ 7.5mA
• Current - Dc Forward (if): 20mA
• Input Type: DC
• Output Type: Open Collector
• Mounting Type: Through Hole
• Package / Case: 8-DIP (0.300", 7.62mm)
• No. Of Channels: 1
• Isolation Voltage: 2.5kV
• Optocoupler Output Type: Transistor
• Input Current: 20mA
• Output Voltage: 5.5V
• Opto Case Style: DIP
• No. Of Pins: 8
• Approval Bodies: UL
• Rohs Compliant: Yes
• Lead Free Status / RoHS Status: Contains lead / RoHS non-compliant

9
For example, let's calculate the operating life of the GaAs LED, based on the data shown on page 60.
Here is an example of how to read an operating life, assuming that the ambient temperature (Ta) is 40°C and that the failure
criterion is a 30% decrease in light output.
Suppose that the initial LED current, IF, is 20 mA. Since the horizontal axis of the failure criteria graph is the reciprocal of absolute
temperature, it is necessary to convert the ambient temperature (Ta) to the reciprocal of absolute temperature (T):
The graph shows the projected lifetimes for F50% and F0.1% cumulative failure probabilities in solid and dashed lines respectively.
Normally, it is recommended to use F0.1% lines.
As X = 3.19, its intersection with the IF = 20 mA line for F0.1% is approximately 80,000 hours. (This figure is for reference only.)
You can also estimate the projected operating life from the projected light output degradation data.
Reading the Projected LED Operating Life Graph
Device Degradation
T =
Ta + 273.15
1
=
10000000
1000000
100000
40 + 273.15
80000
10000
1000
140
120
100
100
80
70
60
40
20
0
227
2.0
1
1
–30%
I
I
I
I
I
F
F
F
F
F
150
Failure criteria for light output degradation Δ P O < –30%
= 10mA
= 20mA
= 30mA
= 40mA
= 50mA
10
3.19 × 10
100 85
Test conditions: I
3.0
60
3.19
100
−3
40
Test time (h)
64
F
25
= 20 mA, Ta = 40°C
1000
0
4.0
I
I
I
I
I
−20
F
F
F
F
F
= 10mA
= 20mA
= 30mA
= 40mA
= 50mA
Projected F50%
operating life
Projected F0.1%
operating life
Ambient Temperature (°C)
10000
X-3σ
−50
1/K(×10
X
80000
100000
−73
5.0
–3
)