MT36HTF25672FY-53EB3E3 Micron Technology Inc, MT36HTF25672FY-53EB3E3 Datasheet - Page 5

• Manufacturer Part Number: MT36HTF25672FY-53EB3E3
• Description: MODULE DDR2 2GB 240-DIMM
• Manufacturer: Micron Technology Inc

Specifications of MT36HTF25672FY-53EB3E3

• Memory Type: DDR2 SDRAM
• Memory Size: 2GB
• Speed: 533MT/s
• Package / Case: 240-DIMM
• Main Category: DRAM Module
• Sub-category: DDR2 SDRAM
• Module Type: 240FBDIMM
• Device Core Size: 72b
• Organization: 256Mx72
• Total Density: 2GByte
• Chip Density: 512Mb
• Package Type: FBDIMM
• Maximum Clock Rate: 533MHz
• Operating Supply Voltage (typ): 1.8V
• Number Of Elements: 36
• Operating Supply Voltage (max): 1.9V
• Operating Supply Voltage (min): 1.7V
• Operating Temp Range: 0C to 95C
• Operating Temperature Classification: Commercial
• Pin Count: 240
• Mounting: Socket
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

Table 6:
PDF: 09005aef829a1e4d/Source: 09005aef8297c0ad
HTF36C256_512x72F_RC_H.fm - Rev. B 9/09 EN
PN#[13:0]
SN#[13:0]
Symbol
PN[13:0]
SN[13:0]
PS#[9:0]
SS#[9:0]
M_TEST
RESET#
SA[2:0]
V
PS[9:0]
SS[9:0]
SCK#
DNU
SDA
DDSPD
SCK
V
SCL
V
V
V
DD
CC
TT
SS
Pin Descriptions
Output
Output
Output
Output
Supply
Supply
Supply
Supply
Supply
Supply
Input
Input
Input
Input
Input
Input
Input
Type
I/O
I/O
–
–
Description
Primary southbound data, positive lines.
Primary southbound data, negative lines.
Serial presence-detect (SPD) clock input.
System clock input, positive line.
System clock input, negative line.
Secondary southbound data, positive lines.
Secondary southbound data, negative lines.
Primary northbound data, positive lines.
Primary northbound data, negative lines.
Secondary northbound data, positive lines.
Secondary northbound data, negative lines.
SPD address inputs; also used to select the FBDIMM number in the AMB.
SPD data input/output.
AMB reset signal.
AMB core power and AMB channel interface power (1.5V).
DRAM power and AMB DRAM I/O power (1.8V).
SPD/AMB SMBus power (3.3V).
Ground.
DRAM address/command/clock termination power (V
The M_TEST pin provides an external connection for testing the margin of V
produced by a voltage divider on the module. It is not intended to be used in normal system
operation and must not be connected (DNU) in a system. This test pin may have other
features on future card designs and will be included in this specification at that time.
Do not use.
2GB, 4GB (x72, DR) 240-Pin DDR2 SDRAM FBDIMM
5
Micron Technology, Inc., reserves the right to change products or specifications without notice.
Pin Assignments and Descriptions
DD
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©2007 Micron Technology, Inc. All rights reserved.
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