DS26334DK Maxim Integrated Products, DS26334DK Datasheet - Page 92

• Manufacturer Part Number: DS26334DK
• Description: KIT DESIGN FOR DS26334
• Manufacturer: Maxim Integrated Products

Specifications of DS26334DK

• Main Purpose: Telecom, Line Interface Units (LIUs)
• Utilized Ic / Part: DS26334
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Secondary Attributes: -
• Embedded: -
• Primary Attributes: -
• Lead Free Status / Rohs Status: Lead free / RoHS Compliant

7 JTAG BOUNDARY SCAN ARCHITECTURE AND TEST ACCESS PORT
The DS26334 IEEE 1149.1 design supports the standard instruction codes SAMPLE/PRELOAD, BYPASS, and
EXTEST. Optional public instructions included are HIGHZ, CLAMP, and IDCODE. The DS26334 contains the
following as required by IEEE 1149.1 Standard Test-Access Port and Boundary-Scan Architecture:
Details on Boundary Scan Architecture and the Test Access Port can be found in IEEE 1149.1-1990, IEEE
1149.1a-1993, and IEEE 1149.1b-1994. The Test Access Port has the necessary interface pins: TRSTB, TCLK,
TMS,
go to
Figure 7-1. JTAG Functional Block Diagram
www.maxim-ic.com/tools/bsdl/
Test Access Port (TAP)
TAP Controller
Instruction Register
TDI,
and
10kΩ
TDO.
+V
TDI
See
10kΩ
+V
and search for DS26334.
the
TMS
DS26334 3.3V, 16-Channel, E1/T1/J1 Short/Long-Haul Line Interface Unit
pin
TEST ACCESS PORT
BOUNDARY SCAN
INDENTIFICATION
CONTROLLER
INSTRUCTION
REGISTER
REGISTER
REGISTER
REGISTER
descriptions
BYPASS
TCLK
92 of 121
10kΩ
+V
TRSTB
for
SELECT
OUTPUT ENABLE
Bypass Register
Boundary Scan Register
Device Identification Register
details.
MUX
For
the
TDO
latest
BSDL
files