C8051F000DK-H Silicon Laboratories Inc, C8051F000DK-H Datasheet - Page 166
C8051F000DK-H
Manufacturer Part Number
C8051F000DK-H
Description
DEV KIT FOR C8051F000/F001/F002
Manufacturer
Silicon Laboratories Inc
Datasheet
1.C8051F005-TB.pdf
(171 pages)
Specifications of C8051F000DK-H
Lead Free Status / RoHS Status
Contains lead / RoHS non-compliant
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21.1.1. EXTEST Instruction
The EXTEST instruction is accessed via the IR. The Boundary DR provides control and observability of all the
device pins as well as the SFR bus and Weak Pullup feature. All inputs to on-chip logic are set to one.
21.1.2. SAMPLE Instruction
The SAMPLE instruction is accessed via the IR. The Boundary DR provides observability and presetting of the
scan-path latches.
21.1.3. BYPASS Instruction
The BYPASS instruction is accessed via the IR. It provides access to the standard 1-bit JTAG Bypass data register.
21.1.4. IDCODE Instruction
The IDCODE instruction is accessed via the IR. It provides access to the 32-bit Device ID register.
Version = 0000b (Revision A) or
Part Number = 0000 0000 0000 0000b or
Manufacturer ID = 0010 0100 001b (Silicon Laboratories)
Bit31
= 0001b (Revision B)
Version
= 0000 0000 0000 0010b
Bit28
Figure 21.2. DEVICEID: JTAG Device ID Register
Bit27
Part Number
Bit12
Rev. 1.7
Bit11
Manufacturer ID
C8051F000/1/2/5/6/7
C8051F010/1/2/5/6/7
Bit1
Bit0
1
Reset Value
(Varies)
166
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