1812SC103KAT1A AVX Corporation, 1812SC103KAT1A Datasheet - Page 2
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1812SC103KAT1A
Manufacturer Part Number
1812SC103KAT1A
Description
CAP CER 10000PF 1500V X7R 1812
Manufacturer
AVX Corporation
Specifications of 1812SC103KAT1A
Capacitance
10000pF
Package / Case
1812 (4532 Metric)
Voltage - Rated
1500V (1.5kV)
Tolerance
±10%
Temperature Coefficient
X7R
Mounting Type
Surface Mount, MLCC
Operating Temperature
-55°C ~ 125°C
Features
High Voltage
Applications
General Purpose
Size / Dimension
0.177" L x 0.126" W (4.50mm x 3.20mm)
Thickness
2.54mm Max
Tolerance (+ Or -)
10%
Voltage
1500VDC
Temp Coeff (dielectric)
X7R
Operating Temp Range
-55C to 125C
Mounting Style
Surface Mount
Construction
SMT Chip
Case Style
Ceramic Chip
Failure Rate
Not Required
Wire Form
Not Required
Product Length (mm)
4.5mm
Product Depth (mm)
3.2mm
Product Height (mm)
2.54mm
Product Diameter (mm)
Not Requiredmm
Capacitor Application
High Voltage
Dielectric Characteristic
X7R
Capacitance Tolerance
± 10%
Voltage Rating
1500VDC
Capacitor Case Style
1812
No. Of Pins
2
Rohs Compliant
Yes
Case Size
1812
Material, Element
Ceramic
Special Features
High Voltage
Termination
SMT
Voltage, Rating
1500 VDC
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Ratings
-
Lead Spacing
-
Lead Free Status / Rohs Status
RoHS Compliant part
Other names
1812SC103KAT1A
478-4735-2
478-4735-2
X7R Dielectric
Specifications and Test Methods
Resistance to
Resistance to
Operating Temperature Range
Solder Heat
Load Life
Humidity
Stresses
Thermal
Flexure
Shock
Load
Insulation Resistance
Dielectric Strength
Dissipation Factor
Parameter/Test
Capacitance
Solderability
Capacitance
Capacitance
Capacitance
Capacitance
Capacitance
Appearance
Appearance
Appearance
Appearance
Appearance
Resistance
Resistance
Resistance
Resistance
Resistance
Dissipation
Dissipation
Dissipation
Dissipation
Dissipation
Insulation
Insulation
Insulation
Insulation
Insulation
Dielectric
Dielectric
Dielectric
Dielectric
Variation
Variation
Strength
Variation
Strength
Variation
Strength
Variation
Strength
Factor
Factor
Factor
Factor
Factor
No defects, <25% leaching of either end terminal
≥ 95% of each terminal should be covered
No breakdown or visual defects
≥ Initial Value x 0.3 (See Above)
≥ Initial Value x 0.3 (See Above)
Meets Initial Values (As Above)
Meets Initial Values (As Above)
Meets Initial Values (As Above)
Meets Initial Values (As Above)
≤ Initial Value x 2.0 (See Above)
Meets Initial Values (As Above)
≤ Initial Value x 2.0 (See Above)
Meets Initial Values (As Above)
100,000MΩ or 1000MΩ - µF,
Meets Initial Values (As Above)
Meets Initial Values (As Above)
Meets Initial Values (As Above)
X7R Specification Limits
≤ 2.5% for ≥ 50V DC rating
≤ 5.0% for ≤ 10V DC rating
Within specified tolerance
≤ 3.0% for 25V DC rating
≤ 3.5% for 16V DC rating
≥ Initial Value x 0.3
No visual defects
-55ºC to +125ºC
whichever is less
with fresh solder
No visual defects
No visual defects
No defects
≤ ±12.5%
≤ ±12.5%
≤ ±12%
≤ ±7.5%
≤ ±7.5%
1-5 seconds, w/charge and discharge current
Charge device with 300% of rated voltage for
seconds. Store at room temperature for 24 ± 2
hours before measuring electrical properties.
Dip device in eutectic solder at 260ºC for 60
Step 1: -55ºC ± 2º
Step 2: Room Temp
Step 3: +125ºC ± 2º
Step 4: Room Temp
Repeat for 5 cycles and measure after
24 ± 2 hours at room temperature
Dip device in eutectic solder at 230 ± 5ºC
85% ± 5% relative humidity for 1000 hours
Store in a test chamber set at 85ºC ± 2ºC/
Note: Charge device with 150% of rated
Charge device with twice rated voltage in
Remove from test chamber and stabilize
Remove from chamber and stabilize at
120 ± 5 secs @ room temp/humidity
For Cap > 10 µF, 0.5Vrms @ 120Hz
Charge device with rated voltage for
at room temperature for 24 ± 2 hours
(+48, -0) with rated voltage applied.
room temperature and humidity for
test chamber set at 125ºC ± 2ºC
24 ± 2 hours before measuring.
Temperature Cycle Chamber
voltage for 500V devices.
Measuring Conditions
Voltage: 1.0Vrms ± .2V
for 1000 hours (+48, -0)
Test Time: 30 seconds
limited to 50 mA (max)
Freq.: 1.0 kHz ± 10%
for 5.0 ± 0.5 seconds
before measuring.
Deflection: 2mm
90 mm
1mm/sec
30 ± 3 minutes
≤ 3 minutes
30 ± 3 minutes
≤ 3 minutes
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