PIC18F26K22-I/SO Microchip Technology, PIC18F26K22-I/SO Datasheet - Page 325

• Manufacturer Part Number: PIC18F26K22-I/SO
• Description: IC PIC MCU 64KB FLASH 28SOIC
• Manufacturer: Microchip Technology
• Series: PIC® XLP™ 18Fr

Specifications of PIC18F26K22-I/SO

• Core Size: 8-Bit
• Program Memory Size: 64KB (32K x 16)
• Core Processor: PIC
• Speed: 64MHz
• Connectivity: I²C, SPI, UART/USART
• Peripherals: Brown-out Detect/Reset, HLVD, POR, PWM, WDT
• Number Of I /o: 24
• Program Memory Type: FLASH
• Eeprom Size: 1K x 8
• Ram Size: 3.8K x 8
• Voltage - Supply (vcc/vdd): 1.8 V ~ 5.5 V
• Data Converters: A/D 19x10b
• Oscillator Type: Internal
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 28-SOIC (0.300", 7.50mm Width)
• Controller Family/series: PIC18
• No. Of I/o's: 25
• Eeprom Memory Size: 1KB
• Ram Memory Size: 3896Byte
• Cpu Speed: 64MHz
• No. Of Timers: 7
• Processor Series: PIC18F
• Core: PIC
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

19.3.2
There is a small amount of capacitance from the
internal A/D Converter sample capacitor as well as
stray capacitance from the circuit board traces and
pads that affect the precision of capacitance
measurements.
capacitance can be taken by making sure the desired
capacitance to be measured has been removed. The
measurement is then performed using the following
steps:
1.
2.
3.
4.
5.
6.
where I is known from the current source measurement
step, t is a fixed delay and V is measured by performing
an A/D conversion.
This measured value is then stored and used for
calculations of time measurement or subtracted for
capacitance measurement. For calibration, it is
expected that the capacitance of C
approximately known. C
An iterative process may need to be used to adjust the
time, t, that the circuit is charged to obtain a reasonable
voltage reading from the A/D Converter. The value of t
may be determined by setting C
value, then solving for t. For example, if C
theoretically calculated to be 11 pF, and V is expected
to be 70% of V
or 63 s.
See Example 19-3 for a typical routine for CTMU
capacitance calibration.
 2010 Microchip Technology Inc.
Initialize the A/D Converter and the CTMU.
Set EDG1STAT (= 1).
Wait for a fixed delay of time t.
Clear EDG1STAT.
Perform an A/D conversion.
Calculate the stray and A/D sample capacitances:
C
OFFSET
CAPACITANCE CALIBRATION
(4 pF + 11 pF) • 2.31V/0.55 A
DD
, or 2.31V, then t would be:
A
=
C
measurement
STRAY
AD
is approximately 4 pF.
+
C
OFFSET
AD
=
STRAY
of

to a theoretical
I t 
 V 
the
+ C
STRAY
AD
stray
Preliminary
is
is
PIC18(L)F2X/4XK22
DS41412A-page 325