M38510/20304BFA E2V, M38510/20304BFA Datasheet - Page 24

• Manufacturer Part Number: M38510/20304BFA
• Manufacturer: E2V

Specifications of M38510/20304BFA

• Lead Free Status / RoHS Status: Supplier Unconfirmed

8/
9/ The outputs are loaded per figure 5.
10/ SEQUENTIAL TEST (PROGRAMMED PROM)
11/ The limits shall be as follows:
12/ For unprogrammed circuit G devices; apply 11.0 V on pin 7 (A
GALPAT (PROGRAMMED PROM)
This program will test all bits in the array, the addressing and interaction between bits for ac performance, t
t
Description
This program will test all bits in the array for t
Description
PLH1
1. Word 0 is read.
2. Word 1 is read
3. Word 0 is read
4. Word 2 is read
5. Word 0 is read
6. The reading procedure continues back and forth between word 0 and the next higher numbered word until word
7. Pass execution time = (n2 + n) x cycle time. n = 256.
8. The GALPAT tests shall be performed with V
1. Each word in the pattern is tested from the enable lines to the output lines for recovery.
2. Word 0 is addressed. Enable line is pulled hi to lo and lo to hi. t
3. Word 1 is addressed. Same enable sequence as above.
4. The reading procedure continues until word 255 is reached.
5. Pass execution time = 256 x cycle time.
6. The sequential tests shall be performed with V
. Each bit in the pattern is fixed by being programmed with a “H” or “L”.
255 is reached, then increments to the next word and reads back and forth as in steps 1 through 6 and shall
include all words.
T
T
T
T
PHL1
PLH1
PHL2
PLH2
Device 01,02
PHL2
MIL-M-38510/203E
75 ns
75 ns
35 ns
35 ns
and t
CC
CC
PLH2
= 4.5 V and 5.5 V.
= 4.5 V and 5.5 V
24
.
T
T
T
T
PHL1
PLH1
PHL2
PLH2
Device 03,04
2
).
PHL2
35 ns
35 ns
20 ns
20 ns
and t
PLH2
are read.
PHL1
, and