H5PS5162FFR-S6C HYNIX SEMICONDUCTOR, H5PS5162FFR-S6C Datasheet - Page 26

• Manufacturer Part Number: H5PS5162FFR-S6C
• Description: 58T1896
• Manufacturer: HYNIX SEMICONDUCTOR

Specifications of H5PS5162FFR-S6C

• Memory Type: SDRAM
• Memory Configuration: 32M X 16
• Memory Case Style: FBGA
• No. Of Pins: 84
• Operating Temperature Range: 0°C To +85°C
• Memory Size: 512 Mbit
• Voltage Vcc: 1.8V
• Rohs Compliant: Yes

Release
H5PS5162FFR series
Although for slow slew rates the total setup time might be negative(i.e. a valid input signal will not have reached VIH/
IL(ac) at the time of the rising clock transition) a valid input signal is still required to complete the transition and reach
VIH/IL(ac).
For slew rate in between the values listed in table x, the derating valued may obtained by linear interpolation.
These values are typically not subject to production test. They are verified by design and characterization.
Hold(tDH) nominal slew rate for a rising signal is defined as the slew rate rate between the last crossing of Vil(dc) max
and the first crossing of VREF(dc). Hold (tDH) nominal slew rate for a falling signal is defined as the slew rate between
the last crossing of Vih(dc) min and the first crossing of VREF(dc). If the actual signal is earlier than the nominal slew
rate line anywhere between shaded ‘dc to VREF(dc) region’, the slew rate of a tangent line to the actual signal from the
dc level to VREF(dc) level is used for derating value(see Fig d.)
Although for slow slew rates the total setup time might be negative(i.e. a valid input signal will not have reached VIH/
IL(ac) at the time of the rising clock transition) a valid input signal is still required to complete the transition and reach
VIH/IL(ac).
For slew rate in between the values listed in table x, the derating valued may obtained by linear interpolation.
These values are typically not subject to production test. They are verified by design and characterization.
Rev. 1.0 / July. 2008
26