PM75B4LB060_11 MITSUBISHI [Mitsubishi Electric Semiconductor], PM75B4LB060_11 Datasheet - Page 5

• Manufacturer Part Number: PM75B4LB060_11
• Description: FLAT-BASE TYPE INSULATED PACKAGE
• Manufacturer: MITSUBISHI [Mitsubishi Electric Semiconductor]

PRECAUTIONS FOR TESTING
1. Before appling any control supply voltage (V
2. When performing “SC” tests, the turn-off surge voltage spike at the corresponding protection operation should not be al-
sponding supply voltage and each input signal should be kept off state.
After this, the specified ON and OFF level setting for each input signal should be done.
lowed to rise above V
(These test should not be done by using a curve tracer or its equivalent.)
a) Lower Arm Switching
b) Upper Arm Switching
V
(15V)
V
V
CIN
CIN
CIN
Fig. 3 Switching Time and SC Test Circuit
( 15V )
( 15V )
V
(0V)
CES
V
V
CIN
CIN
CIN
1.5V: Input on threshold voltage Vth(on) typical value, 2V: Input off threshold voltage Vth(off) typical value
rating of the device.
IPM’ input signal V
IPM’ input signal V
(Lower Arm)
(Lower Arm)
(Upper Arm)
(Upper Arm)
Signal input
Signal input
Signal input
Signal input
IN
Fo
V
V
Fig. 1 V
(Upper Arm)
(Lower Arm)
D
D
Fig. 5 I
IN
Fo
(all)
(all)
0V
0V
P, (U,V)
U,V, (N)
CE(sat)
CES
Fo
Fo
V
V
U,V, (N)
P, (U,V)
D
D
Fig. 7 Dead Time Measurement Point Example
CIN
CIN
(all)
(all)
Test
Fo
Test
Fo
V
D
A
), the input terminals should be pulled up by resistores, etc. to their corre-
U,V
U,V
2V
N
P
P
N
t
dead
1.5V
Pulse
Ic
Ic
Ic
C
C
V
S
S
CE
Vcc
Vcc
V
(15V)
2V
CIN
t
dead
1.5V
td(on)
V
CIN
V
(ton= td(on) + tr)
CIN
V
Fig. 4 Switching Time Test Waveform
10%
Ic
Fo
D
IN
Fo
Fig. 2 V
(all)
90%
Fig. 6 SC Test Waveform
2V
tr
U,V, (N)
trr
t
EC
dead
P, (U,V)
1.5V
toff(SC)
tc(on)
10%
Test
Irr
Short Circuit Current
Constant Current
V
Ic
td(off)
tc(off)
10%
(toff= td(off) + tf)
– Ic
t
t
SC Trip
PM75B4LB060
90%
INSULATED PACKAGE
tf
10%
V
CE
FLAT-BASE TYPE
Oct. 2005