AM29F200B AMD [Advanced Micro Devices], AM29F200B Datasheet - Page 8

• Manufacturer Part Number: AM29F200B
• Description: 2 Megabit (256 K x 8-Bit/128 K x 16-Bit) CMOS 5.0 Volt-only, Sectored Flash Memory-Die Revision 1
• Manufacturer: AMD [Advanced Micro Devices]

PRODUCT TEST FLOW
Figure 1 provides an overview of AMD’s Known Good
Die test flow. For more detailed information, refer to the
Am29F200B product qualification database supple-
ment for KGD. AMD implements quality assurance pro-
cedures throughout the product test flow. In addition,
Packaging for Shipment
24 hours at 250°C
Hot Temperature
Figure 1. AMD KGD Product Test Flow
Wafer Sort 1
Wafer Sort 2
Wafer Sort 3
Shipment
Am29F200B Known Good Die
Bake
S U P P L E M E N T
an off-line quality monitoring program (QMP) further
guarantees AMD quality standards are met on Known
Good Die products. These QA procedures also allow
AMD to produce KGD products without requiring or
implementing burn-in.
Incoming Inspection
Wafer Saw
Die Separation
100% Visual Inspection
Die Pack
Data Retention
DC Parameters
Functionality
Programmability
Erasability
DC Parameters
Functionality
Programmability
Erasability
DC Parameters
Functionality
Programmability
Erasability
Speed
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