M93S66-WMN6P STMicroelectronics, M93S66-WMN6P Datasheet - Page 24

IC EEPROM 4KBIT 2MHZ 8SOIC

M93S66-WMN6P

Manufacturer Part Number
M93S66-WMN6P
Description
IC EEPROM 4KBIT 2MHZ 8SOIC
Manufacturer
STMicroelectronics
Datasheets

Specifications of M93S66-WMN6P

Format - Memory
EEPROMs - Serial
Memory Type
EEPROM
Memory Size
4K (256 x 16)
Speed
2MHz
Interface
Microwire, 3-Wire Serial
Voltage - Supply
2.5 V ~ 5.5 V
Operating Temperature
-40°C ~ 85°C
Package / Case
8-SOIC (3.9mm Width)
Organization
256 K x 16
Interface Type
Microwire
Maximum Clock Frequency
2 MHz
Supply Voltage (max)
5.5 V
Supply Voltage (min)
2.5 V
Maximum Operating Current
2 mA
Maximum Operating Temperature
+ 85 C
Mounting Style
SMD/SMT
Minimum Operating Temperature
- 40 C
Operating Supply Voltage
2.5 V, 5.5 V
Capacitance, Input
5 pF
Capacitance, Output
5 pF
Current, Input, Leakage
±2.5 μA
Current, Operating
2 mA
Current, Output, Leakage
±2.5
Current, Supply
1.5⁄2.0 mA
Data Retention
>40 yrs.
Density
4K
Package Type
SO8
Temperature, Operating
-40 to +85 °C
Temperature, Operating, Maximum
85 °C
Temperature, Operating, Minimum
-40 °C
Time, Address Setup
50
Time, Fall
50 ns
Time, Rise
50 ns
Voltage, Esd
4000 V
Voltage, Input, High
3.5 to 6.5 V
Voltage, Input, High Level
0.7 V
Voltage, Input, Low
0.5 to 1.1 V
Voltage, Input, Low Level
–0.45 V
Voltage, Output, High
6 to 13.2 V
Voltage, Output, Low
0.4 V
Voltage, Supply
2.5 to 5.5 V
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Other names
497-8598-5
M93S66-WMN6P
M93S66, M93S56, M93S46
Table 18. AC Characteristics (M93Sx6-W, Device Grade 3)
Note: 1. t
24/34
Symbol
t
t
t
t
t
t
PRVCH
t
t
t
t
t
t
t
CLPRX
t
CHCL
CLCH
t
t
SLSH
t
WVCH
CHQV
SLWX
SLCH
SHCH
DVCH
CHDX
CLSH
SHQV
CHQL
SLQZ
CLSL
t
2. Chip Select Input (S) must be brought Low for a minimum of tSLSH between consecutive instruction cycles.
3. New product: identified by Process Identification letter W or G.
f
W
C
CHCL
2
1
1
+ t
CLCH
t
t
PRES
t
PREH
t
t
t
t
t
t
t
t
t
Alt.
t
t
t
CSH
f
PES
PEH
CSS
SKH
SKS
t
t
PD0
PD1
SKL
DIS
DIH
WP
SK
CS
SV
DF
1 / f
C
.
Clock Frequency
Protect Enable Valid to Clock High
Write Enable Valid to Clock High
Clock Low to Protect Enable Transition
Chip Select Low to Write Enable Transition
Chip Select Low to Clock High
Chip Select Set-up Time
Chip Select Low to Chip Select High
Clock High Time
Clock Low Time
Data In Set-up Time
Data In Hold Time
Clock Set-up Time (relative to S)
Chip Select Hold Time
Chip Select to Ready/Busy Status
Chip Select Low to Output Hi-Z
Delay to Output Low
Delay to Output Valid
Erase/Write Cycle time
Test conditions specified in
Parameter
Table 9.
and
Table 6.
Min.
D.C.
250
200
200
200
50
50
50
50
50
50
50
0
0
3
Max.
200
100
200
200
2
5
3
MHz
Unit
ms
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns

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