AT89C5122D-RDRUM Atmel, AT89C5122D-RDRUM Datasheet - Page 188

• Manufacturer Part Number: AT89C5122D-RDRUM
• Description: IC 8051 MCU 32K CRAM USB 64-VQFP
• Manufacturer: Atmel
• Series: 89Cr

Specifications of AT89C5122D-RDRUM

• Core Processor: 8051
• Core Size: 8-Bit
• Speed: 48MHz
• Connectivity: SmartCard, SPI, UART/USART, USB
• Peripherals: LED, POR, WDT
• Number Of I /o: 46
• Program Memory Size: 32KB (32K x 8)
• Program Memory Type: FLASH
• Ram Size: 768 x 8
• Voltage - Supply (vcc/vdd): 3 V ~ 5.5 V
• Oscillator Type: Internal
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 64-TQFP, 64-VQFP
• For Use With: AT89OCD-01 - USB EMULATOR FOR AT8XC51 MCUAT89STK-10 - KIT EVAL APPL MASS STORAGEAT89STK-03 - KIT STARTER FOR MCU AT8XC5122/23
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Eeprom Size: -
• Data Converters: -
• Other names: AT89C5122D-RDRUMTR

Card VCC 1.8V Power Supply (for IEC7816-3 Class C cards)
Notes:
Smart Card CCLK, DC parameters
Notes:
Smart Card CIO, DC Parameters
188
Symbol
Vcc
CI
CV
T
T
Symbol
V
I
V
I
t
Symbol
V
I
V
I
V
OL
OH
R
IL
IH
OFF
ON
OL
OH
IL
IH
OL
CC_ovf
t
CC
F
1. Test conditions, Capacitor 10 μF, Inductance 10 μH.
2. Ceramic X7R, SMD type capacitor with minimum ESR or 250 m is mandatory
1. The voltage on CLK should remain between -0.3V and
AT83R5122, AT8xC5122/23
Parameter
Card Supply Current overflow
Card Supply Voltage
CVcc to 0
0 to CVcc
Power Supply
Parameter
Output Low Voltage
Output Low Current
Output High Voltage
Output High Current
Rise and Fall delays
Voltage Stability
Frequency variation (Jitter)
Cycle ratio
Parameter
Input Low Voltage
Input Low Current
Input High Voltage
Input High Current
Output Low Voltage
0.6 CV
CV
0.8 CV
0.8 CV
CV
Min
1.68
Min
3.0
-0.25
Min
0
0
45%
0
CC
CC
(1)
(1)
(1)
-0,5
-0.5
CC
CC
CC
V
CC
+0.3V during dynamic operation.
Typ
Typ
Typ
100
CV
0.15 CV
0.15 CV
0.4 CV
CC
CV
0.15 CV
Max
14.5
15.5
55%
0.2 CV
-20 / +20
0.4
1%
15
15
32
+ 0.25
Max
CV
CC
500
Max
1.92
750
750
5.5
CC
CC
CC
CC
CC
CC
Unit
mA
mA
ns
V
V
V
Unit
Unit
mA
V
V
V
A
A
V
V
s
s
Test Conditions
I
I
I
I
I
I
C
C
C
Low level
High level
OH
OH
OH
OH
OH
OH
IN
IN
IN
Test Conditions
CI
Cload=10μF, Lload=10μH
Vcard = CVcc to 0.4V
Cload=10μF, Lload=10μH
Vcard = 0V to CVcc
With Boost at 60%
Test Conditions
I
I
External 10K pull-up tied to
CV
OL
OL
=30pF (5V)
=30pF (3V)
=30pF (1.8V)
= 50 A (5V until 2009)
= 100 A (5V from 2009)
= 100 A (3V & 1.8V)
= 50 A (+5V until 2009)
= 100 A (+5V from 2009)
= 100 A (+3V & 1.8V)
CC
CC
= 1mA (5V & 3V))
= 0.5 mA (1.8V)
= 35 mA
4202F–SCR–07/2008