ST72F63BE1M1 STMicroelectronics, ST72F63BE1M1 Datasheet - Page 148

• Manufacturer Part Number: ST72F63BE1M1
• Description: IC MCU 8BIT 4K FLASH 24-SOIC
• Manufacturer: STMicroelectronics
• Series: ST7r

Specifications of ST72F63BE1M1

• Core Processor: ST7
• Core Size: 8-Bit
• Speed: 8MHz
• Connectivity: I²C, SCI, USB
• Peripherals: DMA, LVD, POR, PWM, WDT
• Number Of I /o: 14
• Program Memory Size: 4KB (4K x 8)
• Program Memory Type: FLASH
• Ram Size: 384 x 8
• Voltage - Supply (vcc/vdd): 4 V ~ 5.5 V
• Oscillator Type: External
• Operating Temperature: 0°C ~ 70°C
• Package / Case: 24-SOIC (7.5mm Width)
• Data Converters: A/D 12x8b
• Processor Series: ST72F6x
• Core: ST7
• Data Bus Width: 8 bit
• Data Ram Size: 384 B
• Interface Type: I2C, SCI
• Maximum Clock Frequency: 8 MHz
• Number Of Programmable I/os: 14
• Number Of Timers: 1
• Maximum Operating Temperature: + 70 C
• Mounting Style: SMD/SMT
• Development Tools By Supplier: ST7MDTU3-EPB/US, ST7MDTULS-EVAL, ST72F63B-SK/RAIS, ST7MDTU3-EMU3, STX-RLINK
• Minimum Operating Temperature: 0 C
• For Use With: 497-5521 - EVAL BOARD LOW SPEED USB
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Eeprom Size: -
• Lead Free Status / Rohs Status: Details

Electrical characteristics
13.7.2
13.7.3
148/186
Electromagnetic Interference (EMI)
Based on a simple application running on the product (toggling 2 LEDs through the I/O
ports), the product is monitored in terms of emission. This emission test is in line with the
norm SAE J 1752/3 which specifies the board and the loading of each pin.
Table 67.
1. Data based on characterization results, not tested in production.
2. Refer to application note AN1709 for data on other package types.
Absolute maximum ratings (electrical sensitivity)
Based on three different tests (ESD, and LU) using specific measurement methods, the
product is stressed in order to determine its performance in terms of electrical sensitivity.
For more details, refer to the application note AN1181.
Electrostatic discharge (ESD)
Electrostatic discharges (a positive then a negative pulse separated by 1 second) are
applied to the pins of each sample according to each pin combination. The sample size
depends on the number of supply pins in the device (3 parts*(n+1) supply pin). This test
conforms to the JESD22-A114A/A115A standard.
Table 68.
1. Data based on characterization results, not tested in production.
Static latchup (LU)
3 complementary static tests are required on 10 parts to assess the latchup performance. A
supply overvoltage (applied to each power supply pin) and a current injection (applied to
each input, output and configurable I/O pin) are performed on each sample. This test
conforms to the EIA/JESD 78 IC latch-up standard. For more details, refer to the application
note AN1181.
Symbol
V
Symbol
ESD(HBM)
S
EMI
Peak level
Parameter
Electrostatic discharge voltage
(human body model)
EMI characteristics
Absolute maximum ratings
(1)
Ratings
V
package conforming to
SAE J 1752/3
DD
=5 V, T
Doc ID 7516 Rev 8
A
Conditions
=+25 °C, SDIP32
(2)
T
A
=+25 °C
Conditions
0.1 MHz to
30 MHz
30 MHz to
130 MHz
130 MHz to
1 GHz
SAE EMI Level
Monitored
frequency
band
[f
Maximum
16/8 MHz
value
Max vs.
OSC
2000
3.5
36
39
26
/f
CPU
(1)
ST7263Bxx
]
dBµV
Unit
Unit
-
V