ST72C254G2M6 STMicroelectronics, ST72C254G2M6 Datasheet - Page 115
![IC MCU 8BIT 8K FLASH SOIC-28](/photos/6/56/65690/stmicroelectronics-28-soic_sml.jpg)
ST72C254G2M6
Manufacturer Part Number
ST72C254G2M6
Description
IC MCU 8BIT 8K FLASH SOIC-28
Manufacturer
STMicroelectronics
Series
ST7r
Datasheets
1.INDART-ST72C254.pdf
(3 pages)
2.ST72C104G1M6.pdf
(141 pages)
3.ST72C215G2M6.pdf
(140 pages)
Specifications of ST72C254G2M6
Core Processor
ST7
Core Size
8-Bit
Speed
16MHz
Connectivity
I²C, SPI
Peripherals
LVD, POR, PWM, WDT
Number Of I /o
22
Program Memory Size
8KB (8K x 8)
Program Memory Type
FLASH
Ram Size
256 x 8
Voltage - Supply (vcc/vdd)
3.2 V ~ 5.5 V
Data Converters
A/D 6x8b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
28-SOIC (7.5mm Width)
Controller Family/series
ST7
No. Of I/o's
22
Ram Memory Size
256Byte
Cpu Speed
8MHz
No. Of Timers
2
Rohs Compliant
Yes
Processor Series
ST72C2x
Core
ST7
Data Bus Width
8 bit
Data Ram Size
256 B
Interface Type
I2C, SPI
Maximum Clock Frequency
16 MHz
Number Of Programmable I/os
22
Number Of Timers
3 bit
Operating Supply Voltage
3.2 V to 5.5 V
Maximum Operating Temperature
+ 85 C
Mounting Style
SMD/SMT
Development Tools By Supplier
ST7MDT1-DVP2/US
Minimum Operating Temperature
- 40 C
On-chip Adc
8 bit
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Lead Free Status / Rohs Status
In Transition
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Part Number:
ST72C254G2M6
Manufacturer:
ST
Quantity:
20 000
EMC CHARACTERISTICS (Cont’d)
14.7.2.2 Static and Dynamic Latch-Up
Electrical Sensitivities
Figure 72. Simplified Diagram of the ESD Generator for DLU
Notes:
1. Class description: A Class is an STMicroelectronics internal specification. All its limits are higher than the JEDEC spec-
ifications, that means when a device belongs to Class A it exceeds the JEDEC standard. B Class strictly covers all the
JEDEC criteria (international standard).
2. Schaffner NSG435 with a pointed test finger.
LU: 3 complementary static tests are required
on 10 parts to assess the latch-up performance.
A supply overvoltage (applied to each power
supply pin), a current injection (applied to each
input, output and configurable I/O pin) and a
power supply switch sequence are performed
on each sample. This test conforms to the EIA/
JESD 78 IC latch-up standard. For more details,
refer to the AN1181 ST7 application note.
Symbol
DLU
LU
ESD
GENERATOR
Static latch-up class
Dynamic latch-up class
R
2)
CH
Parameter
C
=50M
S
150pF
R
D
=330
HV RELAY
DISCHARGE
RETURN CONNECTION
T
T
V
ST72104G, ST72215G, ST72216G, ST72254G
A
A
DD
+25°C
+85°C
5.5V, f
DISCHARGE TIP
DLU: Electro-Static Discharges (one positive
then one negative test) are applied to each pin
of 3 samples when the micro is running to
assess the latch-up performance in dynamic
mode. Power supplies are set to the typical
values, the oscillator is connected as near as
possible to the pins of the micro and the
component is put in reset mode. This test
conforms to the IEC1000-4-2 and SAEJ1752/3
standards and is described in
more details, refer to the AN1181 ST7
application note.
Conditions
OSC
4MHz, T
A
ST7
+25°C
V
V
DD
SS
Class
Figure
A
A
A
1)
72. For
115/140