MCF52100CAE80 Freescale Semiconductor, MCF52100CAE80 Datasheet - Page 23

• Manufacturer Part Number: MCF52100CAE80
• Description: IC MCU 32BIT 80MHZ 64-LQFP
• Manufacturer: Freescale Semiconductor
• Series: MCF521xxr

Specifications of MCF52100CAE80

• Core Processor: Coldfire V2
• Core Size: 32-Bit
• Speed: 80MHz
• Connectivity: I²C, SPI, UART/USART
• Peripherals: DMA, LVD, POR, PWM, WDT
• Number Of I /o: 43
• Program Memory Size: 64KB (64K x 8)
• Program Memory Type: FLASH
• Ram Size: 16K x 8
• Voltage - Supply (vcc/vdd): 3 V ~ 3.6 V
• Data Converters: A/D 8x12b
• Oscillator Type: Internal
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 64-LQFP
• Processor Series: MCF521x
• Core: ColdFire V2
• Data Bus Width: 32 bit
• Data Ram Size: 16 KB
• Interface Type: I2C/QSPI/UART
• Maximum Clock Frequency: 80 MHz
• Number Of Programmable I/os: 56
• Number Of Timers: 10
• Operating Supply Voltage: - 0.3 V to + 4 V
• Maximum Operating Temperature: + 85 C
• Mounting Style: SMD/SMT
• 3rd Party Development Tools: JLINK-CF-BDM26, EWCF
• Development Tools By Supplier: M52210DEMO
• Minimum Operating Temperature: - 40 C
• On-chip Adc: 8-ch x 12-bit
• For Use With: M5211DEMO - KIT DEMO FOR MCF5211
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Eeprom Size: -
• Lead Free Status / Rohs Status: Lead free / RoHS Compliant

1.12
Table 14
1.13
Table 15
1.14
These signals are used as the interface to the on-chip JTAG controller and the BDM logic.
Freescale Semiconductor
General Purpose Timer
PWM Output Channels
Signal Name
Development Serial
Input/Output
Test Mode Select
Test Data Output
Test Data Input
describes the general purpose timer signals.
describes the PWM signals.
Signal Name
JTAG Enable
Signal Name
Breakpoint
Test Reset
Test Clock
General Purpose Timer Signals
Pulse Width Modulator Signals
Debug Support Signals
Clock
Abbreviation
Abbreviation
Abbreviation
GPT[3:0]
PWM[7:0]
JTAG_EN
DSCLK
TRST
TCLK
BKPT
TDO
TMS
TDI
MCF52110 ColdFire Microcontroller, Rev. 1
Table 16. Debug Support Signals
Pulse width modulated output for PWM channels.
Inputs to or outputs from the general purpose timer module.
Select between debug module and JTAG signals at reset.
This active-low signal is used to initialize the JTAG logic
asynchronously.
Used to synchronize the JTAG logic.
Used to sequence the JTAG state machine. TMS is sampled on the
rising edge of TCLK.
Serial input for test instructions and data. TDI is sampled on the rising
edge of TCLK.
Serial output for test instructions and data. TDO is tri-stateable and is
actively driven in the shift-IR and shift-DR controller states. TDO
changes on the falling edge of TCLK.
Development Serial Clock - Internally synchronized input. (The logic
level on DSCLK is validated if it has the same value on two
consecutive rising bus clock edges.) Clocks the serial communication
port to the debug module during packet transfers. Maximum frequency
is PSTCLK/5. At the synchronized rising edge of DSCLK, the data
input on DSI is sampled and DSO changes state.
Breakpoint - Input used to request a manual breakpoint. Assertion of
BKPT puts the processor into a halted state after the current
instruction completes. Halt status is reflected on processor
status/debug data signals (PST[3:0] and PSTDDATA[7:0]) as the
value 0xF. If CSR[BKD] is set (disabling normal BKPT functionality),
asserting BKPT generates a debug interrupt exception in the
processor.
Table 15. PWM Signals
Table 14. GPT Signals
Function
Function
Function
Family Configurations
I/O
I/O
O
O
I
I
I
I
I
I
I
I/O
I/O
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