SAK-TC1797-512F180E AC Infineon Technologies, SAK-TC1797-512F180E AC Datasheet - Page 143

• Manufacturer Part Number: SAK-TC1797-512F180E AC
• Description: IC MCU 32BIT FLASH 416-BGA
• Manufacturer: Infineon Technologies
• Series: TC17xxr

Specifications of SAK-TC1797-512F180E AC

• Core Processor: TriCore
• Core Size: 32-Bit
• Speed: 180MHz
• Connectivity: ASC, CAN, EBI/EMI, MLI, MSC, SSC
• Peripherals: DMA, POR, WDT
• Number Of I /o: 219
• Program Memory Size: 4MB (4M x 8)
• Program Memory Type: FLASH
• Ram Size: 224K x 8
• Voltage - Supply (vcc/vdd): 1.42 V ~ 1.58 V
• Data Converters: A/D 48x12b
• Oscillator Type: External
• Operating Temperature: -40°C ~ 125°C
• Package / Case: 416-BGA
• Packages: PG-BGA-416
• Max Clock Frequency: 180.0 MHz
• Sram (incl. Cache): 224.0 KByte
• Can Nodes: 4
• A / D Input Lines (incl. Fadc): 48
• Program Memory: 4.0 MB
• For Use With: B158-H8537-G2-X-7600IN - KIT STARTER TC179X FAMILY
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Eeprom Size: -
• Other names: SP000432392

Table 11
Parameter
Switched
capacitance at
the analog
voltage inputs
ON resistance of
the transmission
gates in the
analog voltage
path
ON resistance
for the ADC test
(pull-down for
AIN7)
Current through
resistance for the
ADC test (pull-
down for AIN7)
1) Voltage overshoot to tbd. V are permissible, provided the pulse duration is less than 100 µs and the cumulated
2) Voltage overshoot to 1.7 V are permissible, provided the pulse duration is less than 100 µs and the cumulated
3) A running conversion may become inexact in case of violating the normal operating conditions (voltage
4) If
5) If a reduced reference voltage in a range of
6) TUE is tested at
7) ADC module capability.
8) Not subject to production test, verified by design / characterization.
9) The sum of DNL/INL/Gain/Offset errors does not exceed the related TUE total unadjusted error.
10) For 10-bit conversions the DNL/INL/Gain/Offset error values must be multiplied with factor 0.25.
11) The leakage current definition is a continuous function, as shown in
Data Sheet
summary of the pulses does not exceed 1 h.
summary of the pulses does not exceed 1 h.
overshoot).
V
If the reference voltage is reduced with the factor k (k<1), then TUE, DNL, INL Gain and Offset errors increase
with the factor 1/k.
If a reduced reference voltage in a range of 1 V to
ADC speed and accuracy.
For 8-bit conversions the DNL/INL/Gain/Offset error values must be multiplied with 0.0625.
determine the characteristic points of the given continuous linear approximation - they do not define step
function.
AREF
the
= (
V
DDM
reference
+ 0.05 V to
ADC Characteristics (cont’d) (Operating Conditions apply)
V
AREF
Symbol
C
R
R
I
AIN7T
AIN
AIN7T
AINSW
= 5.0 V,
voltage
V
DDM
CC
CC –
CC 180
CC –
V
+ 0.07V), then the accuracy of the ADC decreases by 4LSB12.
AGND
Min.
–
V
= 0 V and
AREF
V
DDM
increases
V
Values
/2 to
DDM
139
V
Typ. Max.
7
700
550
15
rms
DDM
= 5.0 V
V
DDM
/2 is used, then there are additional decrease in the
is used, then the ADC converter errors increase.
20
1500
900
30
peak
or
19)
the
Figure
Unit
pF
Ω
Ω
mA
V
20. The numerical values defined
DDM
Electrical Parameters
Note /
Test Condition
8)18)
8)
Test feature
available only for
AIN7
Test feature
available only for
AIN7
decreases,
8) 20)
8)
V1.1, 2009-04
TC1797
so
that