AT91SAM7S512-MU-999 Atmel, AT91SAM7S512-MU-999 Datasheet - Page 47
![IC MCU ARM7 512KB FLASH 64-VQFN](/photos/12/13/121326/313-64-qfn_sml.jpg)
AT91SAM7S512-MU-999
Manufacturer Part Number
AT91SAM7S512-MU-999
Description
IC MCU ARM7 512KB FLASH 64-VQFN
Manufacturer
Atmel
Series
AT91SAMr
Specifications of AT91SAM7S512-MU-999
Core Processor
ARM7
Core Size
16/32-Bit
Speed
55MHz
Connectivity
I²C, SPI, SSC, UART/USART, USB
Peripherals
Brown-out Detect/Reset, DMA, POR, PWM, WDT
Number Of I /o
32
Program Memory Size
512KB (512K x 8)
Program Memory Type
FLASH
Ram Size
64K x 8
Voltage - Supply (vcc/vdd)
1.65 V ~ 1.95 V
Data Converters
A/D 8x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
64-VQFN Exposed Pad, 64-HVQFN, 64-SQFN, 64-DHVQFN
For Use With
AT91SAM-ICE - EMULATOR FOR AT91 ARM7/ARM9AT91SAM7S-EK - KIT EVAL FOR ARM AT91SAM7S
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
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- Download datasheet (11Mb)
12. Debug and Test Features
12.1
12.2
6175K–ATARM–30-Aug-10
Description
Block Diagram
The AT91SAM7S Series Microcontrollers feature a number of complementary debug and test
capabilities. A common JTAG/ICE (EmbeddedICE) port is used for standard debugging func-
tions, such as downloading code and single-stepping through programs. The Debug Unit
provides a two-pin UART that can be used to upload an application into internal SRAM. It man-
ages the interrupt handling of the internal COMMTX and COMMRX signals that trace the activity
of the Debug Communication Channel.
A set of dedicated debug and test input/output pins gives direct access to these capabilities from
a PC-based test environment.
Figure 12-1. Debug and Test Block Diagram
PDC
Boundary
ARM7TDMI
TAP
DBGU
ICE
ICE/JTAG
AT91SAM7S Series Preliminary
TAP
Reset
and
Test
POR
TMS
TCK
TDI
JTAGSEL
TDO
DTXD
DRXD
TST
47
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