LFXP10E-3FN256I Lattice, LFXP10E-3FN256I Datasheet - Page 59
![no-image](/images/manufacturer_photos/0/3/380/lattice_sml.jpg)
LFXP10E-3FN256I
Manufacturer Part Number
LFXP10E-3FN256I
Description
FPGA - Field Programmable Gate Array 9.7K LUTs 188 IO 1.2 V -3 Spd I
Manufacturer
Lattice
Datasheet
1.LFXP3C-3QN208C.pdf
(130 pages)
Specifications of LFXP10E-3FN256I
Number Of Programmable I/os
188
Data Ram Size
221184
Supply Voltage (max)
1.26 V
Maximum Operating Temperature
+ 100 C
Minimum Operating Temperature
- 40 C
Mounting Style
SMD/SMT
Supply Voltage (min)
1.14 V
Package / Case
FPBGA-256
Number Of Logic Elements/cells
*
Number Of Labs/clbs
*
Total Ram Bits
*
Number Of I /o
*
Number Of Gates
*
Voltage - Supply
*
Mounting Type
*
Operating Temperature
*
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
LFXP10E-3FN256I
Manufacturer:
Lattice Semiconductor Corporation
Quantity:
10 000
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Lattice Semiconductor
Switching Test Conditions
Figure 3-13 shows the output test load that is used for AC testing. The specific values for resistance, capacitance,
voltage, and other test conditions are shown in Figure 3-5.
Figure 3-13. Output Test Load, LVTTL and LVCMOS Standards
Table 3-5. Test Fixture Required Components, Non-Terminated Interfaces
LVTTL and other LVCMOS settings (L -> H, H -> L)
LVCMOS 2.5 I/O (Z -> H)
LVCMOS 2.5 I/O (Z -> L)
LVCMOS 2.5 I/O (H -> Z)
LVCMOS 2.5 I/O (L -> Z)
Note: Output test conditions for all other interfaces are determined by the respective standards.
Test Condition
DUT
V
R1
T
3-28
188
R
1
CL
0pF
0pF
C
L
Test Poi nt
DC and Switching Characteristics
LVCMOS 3.3 = 1.5V
LVCMOS 2.5 = V
LVCMOS 1.8 = V
LVCMOS 1.5 = V
LVCMOS 1.2 = V
V
V
V
V
OH
OL
CCIO
CCIO
+ 0.15
- 0.15
/2
/2
LatticeXP Family Data Sheet
Timing Ref.
CCIO
CCIO
CCIO
CCIO
/2
/2
/2
/2
V
V
V
V
V
—
—
—
—
—
OH
OH
OL
OL
T
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