TXC-06885BIOG Transwitch Corporation, TXC-06885BIOG Datasheet - Page 25

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TXC-06885BIOG

Manufacturer Part Number
TXC-06885BIOG
Description
Manufacturer
Transwitch Corporation
Datasheet

Specifications of TXC-06885BIOG

Operating Supply Voltage (typ)
1.8/3.3V
Operating Temperature Classification
Industrial
Package Type
BGA
Mounting
Surface Mount
Lead Free Status / RoHS Status
Not Compliant

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
TXC-06885BIOG
Manufacturer:
TRANSWITCH
Quantity:
10
PRELIMINARY TXC-06885-MB, Ed. 6A
February 2005
TSTMODE
Symbol
DEVHIZ
RESET
TEST1
SCAN
TRST
TDO
TMS
TCK
TDI
RESET AND TEST LEADS (INCLUDING TEST ACCESS PORT FOR BOUNDARY SCAN)
Lead No.
D21
C22
B23
E21
D22
B16
A17
C16
B17
C17
O(T)
I/O
I
I
I
I
I
I
I
I
I
- Technical Characteristics -
LVTTLpu
LVTTLpu
LVTTLpu
LVTTLpu
CMOS
LVTLL
LVTTL
LVTTL
LVTTL
LVTTL
Type
4 mA
Test Data Output: Boundary scan output for data
and test instructions from internal test registers.
Test Mode Reset: A 1 microsecond (minimum) low
on this lead resets the boundary scan;
recommended for use after power-up initialization as
well. This lead should be held low whenever
boundary scan operations are not being performed.
Test Mode Select: Boundary scan test mode select.
This signal must be pulled high. 4.7k
recommended.
Test Data Input: Boundary scan input for data and
test instructions. 4.7k
Test Clock: Boundary scan clock. Input signals are
clocked in on its rising edge.
Hardware Reset: An active low pulse with minimum
width of 1 ms which must be applied after power is
applied to reset all registers, counters, and FIFOs.
The reset is asynchronous going into the reset state,
but requires all external clocks to be active and
stable during the reset state.
Test Mode: For TranSwitch testing purposes only.
Tie to V
SCAN Test: For TranSwitch testing purposes only.
Tie to V
test.
Test1: For TranSwitch testing purposes only. Tie to
V
Device High Impedance: Active low to set all
outputs (except TDO) to high impedance state. Tie
to V
SS
.
DD33
SS
DD33
.
. Active high to enable device internal scan
. Active low to enable device test.
Name/Function
pull-up recommended.
Envoy-CE4 Device
DATA SHEET
pull-up
TXC-06885
25 o f 12 8

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