5962-8751410XA QP SEMICONDUCTOR, 5962-8751410XA Datasheet - Page 11

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5962-8751410XA

Manufacturer Part Number
5962-8751410XA
Description
Manufacturer
QP SEMICONDUCTOR
Datasheet

Specifications of 5962-8751410XA

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Part Number:
5962-8751410XA
Quantity:
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DSCC FORM 2234
APR 97
1/ DC and read mode.
2/ Equivalent ac test conditions:
3/ Connect all address inputs and OE to V
4/ All pins not being tested are to be open.
5/ Tested initially and after any design or process changes that affect that parameter, and therefore guaranteed to the limits
6/ Tested by application of specified timing signals and conditions, see footnote 2/.
Chip erase time 6/
High voltage 6/
Time to device
Write cycle time
Maximum time to 6/
busy
RDY/BUSY
valid data after
WE/CE low
Device types: 01 through 09 and 13 through 28.
Output load: 1 TTL gate and C1 = 100 pF,
Input rise and fall times < 10 ns.
Input pulse levels: 0.4 V and 2.4 V.
Timing measurements reference levels:
Inputs 1 V and 2 V.
Outputs 0.8 V and 2 V.
specified in table I.
Test
DEFENSE SUPPLY CENTER COLUMBUS
MICROCIRCUIT DRAWING
COLUMBUS, OHIO 43218-3990
STANDARD
│Symbol
│t
│V
│t
│t
│t
│t
│t
│t
WLWH2
EHRL
WHRL
ELRH
WLRH
WLDV
ELDV
H
6/
TABLE I. Electrical performance characteristics - Continued.
│ -55°C < T
│V
│ unless otherwise specified
│See figure 8, configuration
│A or B
│See figures 6 and 7
SS
= 0 V 4.5 V < V
Conditions
IH
and measure I
C
<+125°C
1/ 2/
CC
< 5.5 V
OLZ
and I
Inputs 1 V and 2 V.
Outputs 0.8 V and 2 V.
Device types: 10 through 12.
Output load: 1 TTL gate and C1 = 30 pF.
Input rise and fall times < 5 ns.
Input pulse levels: 0.4 V and 2.4 V.
OHZ
SIZE
│ Group A │ Device
│subgroups │ type
│ 9,10,11
│ 9,10,11
│ 9,10,11
│ 9,10,11
│ 9,10,11
A
with the output under test connected to V
REVISION LEVEL
│01-05,
│23-27
│06-22,28 │ 10
│ All
│13-17,28 │
│23-27
│13-17,28 │
│23-27
│13-22,28 │
F
│ Min
│150
│ 12
Limits
│ Max
│ 13
│ 50
│100
│ 1
│ 10
│ 1
SHEET
5962-87514
OUT
│ Unit
│ ns
│ ms
│ V
│ ns
│ ms
│ μs
.
11

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