5962-8751410XA QP SEMICONDUCTOR, 5962-8751410XA Datasheet - Page 5

• Manufacturer Part Number: 5962-8751410XA
• Manufacturer: QP SEMICONDUCTOR

Specifications of 5962-8751410XA

• Lead Free Status / RoHS Status: Supplier Unconfirmed

DSCC FORM 2234
APR 97
characteristics specified in 4.4.1. Devices shall be shipped in the erased (logic "1's) and verified state unless otherwise
specified.
procedures and characteristics specified in 4.4.
programmed to the specified pattern or erased. As a minimum, verification shall consist of reading the device in accordance
with the procedures and characteristics specified in 4.4.2. Any bit that does not verify to be in the proper state shall constitute
a device failure, and shall be removed from the lot.
reprogrammability test shall be done for initial characterization and after any design or process changes which may affect the
reprogrammability of the device. The methods and procedures may be vendor specific, but shall guarantee the number of
program/erase endurance cycles listed in section 1.3 herein over the full military temperature range. The vendor's procedure
shall be kept under document control and shall be made available upon request of the acquiring or preparing activity, along
with test data.
shall be done for initial characterization and after any design or process change, which may affect data retention. The
methods and procedures may be vendor specific, but shall guarantee the number of years listed in section 1.3 herein over the
full military temperature range. The vendor's procedure shall be kept under document control and shall be made available
upon request of the acquiring or preparing activity, along with test data.
A.
prior to quality conformance inspection. The following additional criteria shall apply:
MIL-STD-883 including groups A, B, C, and D inspections. The following additional criteria shall apply.
3.12 Endurance. A reprogrammability test shall be completed as part of the vendor's reliability monitors. This
3.13 Data retention. A data retention stress test shall be completed as part of the vendor's reliability monitors. This test
4. VERIFICATION
4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix
4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices
4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of
4.3.1 Group A inspection.
a. Burn-in test, method 1015 of MIL-STD-883.
b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter
a. Tests shall be as specified in table II herein.
b. Subgroups 5 and 6 in table I, method 5005 of MIL-STD-883 shall be omitted.
c. Subgroup 4 (C
d. Subgroups 7 and 8 shall include verification of the truth table.
3.10.1 Erasure of EEPROMS. When specified, devices shall be erased in accordance with the procedures and
3.10.2 Programmability of EEPROMS. When specified, devices shall be programmed to the specified pattern using the
3.10.3 Verification of erasure or programmability of EEPROMS. When specified, devices shall be verified as either
tests prior to burn-in are optional at the discretion of the manufacturer.
which may affect capacitance. Sample size is fifteen devices with no failures, and all input and output terminals tested.
(1) Test condition D. The test circuit shall be maintained by the manufacturer under document revision level control
(2) T
(3) Devices shall be burned-in containing a checkerboard pattern or equivalent.
DEFENSE SUPPLY CENTER COLUMBUS
and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the
1015 of MIL-STD-883.
inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method
A
MICROCIRCUIT DRAWING
COLUMBUS, OHIO 43218-3990
= +125°C, minimum.
I
and C
STANDARD
O
measurements) shall be measured only for the initial test and after process or design changes
SIZE
A
REVISION LEVEL
F
SHEET
5962-87514
5