LH75411 NXP Semiconductors, LH75411 Datasheet - Page 35

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LH75411

Manufacturer Part Number
LH75411
Description
Manufacturer
NXP Semiconductors
Datasheet

Specifications of LH75411

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System-on-Chip
Very Low Operating Temperatures and
Noise Immunity
perature of the transistors in the integrated circuit. The
switching speed of the CMOS circuitry within the SoC
depends partly on Tj, and the lower the operating tem-
perature, the faster the CMOS circuits will switch.
Increased switching noise generated by faster switch-
ing circuits could affect the overall system stability. The
amount of switching noise is directly affected by the
application executed on the SoC.
to meet low industrial temperature standards should use
an external oscillator rather than a crystal to drive the
system clock input of the System-on-Chip. This change
from crystal to oscillator will increase the robustness
(i.e., noise immunity of the clock input to the SoC.
Product data sheet
The junction temperature, Tj, is the operating tem-
NXP recommends that users implementing a system
110
105
100
Figure 5. Maximum Core Frequency versus Voltage and Temperature
95
90
85
80
75
70
25
35
45
Rev. 02 — 19 March 2009
NXP Semiconductors
Temp (
55
˚
Celsius)
65
75
85
1.95 V
1.9 V
1.85 V
1.8 V
1.75 V
1.7 V
1.65 V
1.6 V
2 V
LH75401/LH75411
LH754xx-106
35

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