CBTU4411EE-T NXP Semiconductors, CBTU4411EE-T Datasheet - Page 13

• Manufacturer Part Number: CBTU4411EE-T
• Manufacturer: NXP Semiconductors

Specifications of CBTU4411EE-T

• Operating Temperature (max): 85C
• Operating Temperature (min): 0C
• Mounting: Surface Mount
• Lead Free Status / RoHS Status: Compliant

NXP Semiconductors
13. Test information
CBTU4411_3
Product data sheet
Table 10.
Condition
V
V
Fig 13. Test circuit (xDPn to HPn)
bias
bias
= V
< 0.5V
DD
All input pulses are supplied by generators having the following characteristics:
PRR
The outputs are measured one at a time with one transition per measurement.
I
DD
DD
SSTL_18
driver
test mode
10 MHz; Z
Description
All DIMM ports are disconnected (high-impedance) from their host ports, and
disconnected (high-impedance) from VBIAS and R
testing only.
Normal operation. See
Rev. 03 — 12 October 2009
2.54 cm (1")
11-bit DDR2 SDRAM MUX/bus switch with 12
Z o = 40
o
= 50 ; slew rate = 2.5 V/ns.
HPn
DUT
Section 6.1 “Function
xDPn
10.16 cm (4")
Z o = 40
selection”.
PU
C L
6 pF
. Used for production
CBTU4411
75
002aae869
© NXP B.V. 2009. All rights reserved.
V
T
= V
ON resistance
ref
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