MPC8541EVTAPF Freescale Semiconductor, MPC8541EVTAPF Datasheet - Page 20

IC MPU POWERQUICC III 783-FCPBGA

MPC8541EVTAPF

Manufacturer Part Number
MPC8541EVTAPF
Description
IC MPU POWERQUICC III 783-FCPBGA
Manufacturer
Freescale Semiconductor
Series
PowerQUICC IIIr
Datasheets

Specifications of MPC8541EVTAPF

Processor Type
MPC85xx PowerQUICC III 32-Bit
Speed
833MHz
Voltage
1.2V
Mounting Type
Surface Mount
Package / Case
783-FCPBGA
Core Size
32 Bit
Program Memory Size
64KB
Cpu Speed
833MHz
Digital Ic Case Style
BGA
No. Of Pins
783
Supply Voltage Range
1.14V To 1.26V
Rohs Compliant
Yes
Family Name
MPC85XX
Device Core
PowerQUICC III
Device Core Size
32b
Frequency (max)
833MHz
Instruction Set Architecture
RISC
Supply Voltage 1 (typ)
1.2V
Operating Supply Voltage (max)
1.26V
Operating Supply Voltage (min)
1.14V
Operating Temp Range
0C to 105C
Operating Temperature Classification
Commercial
Mounting
Surface Mount
Pin Count
783
Package Type
FCBGA
For Use With
MPC8548CDS - DEV TOOLS CDS FOR 8548CWH-PPC-8540N-VE - KIT EVAL SYSTEM MPC8540
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Features
-
Lead Free Status / Rohs Status
Compliant

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DUART
Figure 6
7
This section describes the DC and AC electrical specifications for the DUART interface of the
MPC8541E.
7.1
Table 16
20
High-level input voltage
Low-level input voltage
Input current
High-level output voltage
Low-level output voltage
Note:
1. Note that the symbol V
DUART
MPC8541E PowerQUICC™ III Integrated Communications Processor Hardware Specification, Rev. 4.2
provides the AC test load for the DDR bus.
provides the DC electrical characteristics for the DUART interface of the MPC8541E.
DUART DC Electrical Characteristics
Parameter
IN
V
V
Notes:
1. Data input threshold measurement point.
2. Data output measurement point.
Output
, in this case, represents the OV
OUT
TH
Symbol
Table 15. DDR SDRAM Measurement Conditions
Table 16. DUART DC Electrical Characteristics
Symbol
V
V
V
V
I
IN
OH
OL
IH
IL
Figure 6. DDR AC Test Load
Z
0
MV
= 50 Ω
OV
V
0.5 × GV
REF
IN
V
DD
V
OUT
DDR
1
Test Condition
OUT
I
= min, I
= 0 V or V
OH
± 0.31 V
OV
IN
≥ V
symbol referenced in
≤ V
DD
= –100 μA
DD
OH
OL
= min,
OL
(min) or
(max)
IN
= 100 μA
= V
DD
R
Unit
L
V
V
= 50 Ω
OV
Table 1
DD
–0.3
Min
2
– 0.2
Notes
GV
and
1
2
DD
Table
/2
OV
DD
Freescale Semiconductor
Max
2.
0.8
0.2
±5
+ 0.3
Unit
μA
V
V
V
V

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