Z0840004PSC Zilog, Z0840004PSC Datasheet - Page 20
![IC 4MHZ Z80 NMOS CPU 40-DIP](/photos/6/57/65796/269-40-dip_sml.jpg)
Z0840004PSC
Manufacturer Part Number
Z0840004PSC
Description
IC 4MHZ Z80 NMOS CPU 40-DIP
Manufacturer
Zilog
Datasheet
1.Z0840004PSC.pdf
(98 pages)
Specifications of Z0840004PSC
Processor Type
Z80
Features
NMOS
Speed
4MHz
Voltage
5V
Mounting Type
Through Hole
Package / Case
40-DIP (0.620", 15.75mm)
Lead Free Status / RoHS Status
Contains lead / RoHS non-compliant
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
Z0840004PSC
Manufacturer:
ZILOG
Quantity:
2 000
Part Number:
Z0840004PSC
Manufacturer:
ZILOG
Quantity:
20 000
Part Number:
Z0840004PSC (Z80CPU)
Manufacturer:
ZILOG
Quantity:
20 000
Part Number:
Z0840004PSC(Z80CPU)
Manufacturer:
ZILOG
Quantity:
20 000
ZiLOG
Equipment At ZEPI
Wetting Balance Tester
ISOMET Low Speed Saw
Curve Tracer
ESD Tester
ESD Tester
HAST
Polimet Polisher
High Power Scope
Low Power Scope
Jet Etch
Hot Plates
Pressure Cooker
Plasmod Plasma Etcher
SEM & EDX
Digital Multimeter
Power Supply
Timer
Acoustic Microscope
Profile Projector
Temperature/Humidity Test
Chamber
Temperature/Humidity Test
Chamber
Salt Atmospheric Chamber
Mechanical Shock Tester
ZAC03-0004
Table 3-1. Summary of QC Test Equipment
Olympus
HP
Brand
Multicore Must II
Buehler
Tektronix 577
IMCS 700
Oryx 11000
Express Test
Buehler
Bausch & Lomb
Novus Technologies
3D Ready-Heat
Electric Steroclave
March Inst Inc
Leica S420
Fluke
Gralab
Sonoscan C-SAM 3100
Mitutoyo
ESPEC
Sexton ESPEC
Associated
Lansmont
Usage
Solderability Test
Cross-Section Analysis
Bench Check
VZAP Testing
VZAP Testing
Reliability Test
Cross-Section Analysis
External/Internal Visual
Inspection
External/Internal Visual
Inspection
Decapping of Plastic Devices
Solderability-Steam Aging
Reliability Test
Topside Etch
Visual & Elemental Analysis
Latchup Test
Latchup Test
Timed Operations
Delamination Inspection
Dimensional Inspection
Temperature/Humidity Test
Moisture Resistance Test
Salt Atmosphere Test
Mechanical Shock Test
2002 Quality and Reliability Report
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