PAC-POWR1220AT8-HS-EVN Lattice, PAC-POWR1220AT8-HS-EVN Datasheet - Page 49

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PAC-POWR1220AT8-HS-EVN

Manufacturer Part Number
PAC-POWR1220AT8-HS-EVN
Description
Supervisory Circuits Pwr Mgr Hercules Std Development Kit
Manufacturer
Lattice
Series
ispPAC®, MachXO, Herculesr

Specifications of PAC-POWR1220AT8-HS-EVN

Silicon Manufacturer
Lattice Semiconductor
Kit Application Type
Power Management
Application Sub Type
Power Manager
Kit Contents
Preloaded Board, Eval Board, AC Adapter, USB Connector Cable
Rohs Compliant
Yes
Main Purpose
Power Management, ORing Controller / Hot Swap Controller
Embedded
Yes, Other
Utilized Ic / Part
ispPAC-POWR1220AT8, LCMXO2280
Primary Attributes
-
Secondary Attributes
-
Lead Free Status / Rohs Status
Lead free / RoHS Compliant
Lattice Semiconductor
DISCHARGE – This instruction is used to discharge the internal programming supply voltage after an erase or pro-
gramming cycle and prepares ispPAC-POWR1220AT8 for a read cycle. This instruction also forces the outputs into
the OUTPUTS_HIGHZ.
CFG_ADDRESS – This instruction is used to set the address of the CFG array for subsequent program or read
operations. This instruction also forces the outputs into the OUTPUTS_HIGHZ.
CFG_DATA_SHIFT – This instruction is used to shift data into the CFG register prior to programming or reading.
This instruction also forces the outputs into the OUTPUTS_HIGHZ.
CFG_ERASE – This instruction will bulk erase the CFG array. The action occurs at the second rising edge of TCK
in Run-Test-Idle JTAG state. The device must already be in programming mode (PROGRAM_ENABLE instruction).
This instruction also forces the outputs into the OUTPUTS_HIGHZ.
CFG_PROGRAM – This instruction programs the selected CFG array column. This specific column is preselected
by using CFG_ADDRESS instruction. The programming occurs at the second rising edge of the TCK in Run-Test-
Idle JTAG state. The device must already be in programming mode (PROGRAM_ENABLE instruction). This
instruction also forces the outputs into the OUTPUTS_HIGHZ.
CFG_VERIFY – This instruction is used to read the content of the selected CFG array column. This specific col-
umn is preselected by using CFG_ADDRESS instruction. This instruction also forces the outputs into the
OUTPUTS_HIGHZ.
BULK_ERASE – This instruction will bulk erase all E
POWR1220AT8. The device must already be in programming mode (PROGRAM_ENABLE instruction). This
instruction also forces the outputs into the OUTPUTS_HIGHZ.
OUTPUTS_HIGHZ – This instruction turns off all of the open-drain output transistors. Pins that are programmed as
FET drivers will be placed in the active low state. This instruction is effective after Update-Instruction-Register
JTAG state.
PROGRAM_ENABLE – This instruction enables the programming mode of the ispPAC-POWR1220AT8. This
instruction also forces the outputs into the OUTPUTS_HIGHZ.
IDCODE – This instruction connects the output of the Identification Code Data Shift (IDCODE) Register to TDO
(Figure 1-40), to support reading out the identification code.
Figure 1-40. IDCODE Register
PROGRAM_DISABLE – This instruction disables the programming mode of the ispPAC-POWR1220AT8. The
Test-Logic-Reset JTAG state can also be used to cancel the programming mode of the ispPAC-POWR1220AT8.
UES_READ – This instruction both reads the E
between the TDI and TDO pins (as shown in Figure 1-41), to support programming or reading of the user electronic
signature bits.
Figure 1-41. UES Register
Bit
15
Bit
31
Bit
14
Bit
30
Bit
13
Bit
12
Bit
29
Bit
11
Bit
28
Bit
10
Bit
27
Bit
9
2
CMOS bits into the UES register and places the UES register
Bit
8
1-49
2
CMOS bits (CFG, PLD, UES, and ESF) in the ispPAC-
Bit
7
Bit
6
Bit
4
ispPAC-POWR1220AT8 Data Sheet
Bit
5
Bit
3
Bit
4
Bit
2
Bit
3
Bit
Bit
1
2
Bit
1
Bit
0
Bit
0
TDO
TDO

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