TS68C429AMFA E2V, TS68C429AMFA Datasheet - Page 10

• Manufacturer Part Number: TS68C429AMFA
• Manufacturer: E2V

Specifications of TS68C429AMFA

• Operating Supply Voltage (typ): 5V
• Operating Supply Voltage (min): 4.5V
• Operating Supply Voltage (max): 5.5V
• Operating Temp Range: -55C to 125C
• Operating Temperature Classification: Military
• Mounting: Surface Mount
• Pin Count: 132
• Lead Free Status / Rohs Status: Compliant

5.4
5.5
6. Quality Conformance Inspection
6.1
7. Electrical Characteristics
7.1
10
0848E–HIREL–02/08
Mechanical and Environment
Marking
DESC/MIL-STD-883
General Requirements
These terms are related by the equation:
minimized by such thermal management techniques as heat sinks, ambient air cooling and thermal con-
vection. Thus, good thermal management on the part of the user can significantly reduce
approximately equals
junction temperature.
The microcircuits shall meet all mechanical environmental requirements of either MIL-STD-883 for class
B devices or DESC devices.
The document where are defined the marking are identified in the related reference documents. Each
microcircuit are legibly and permanently marked with the following information as minimum:
Is in accordance with MIL-M-38510 and method 5005 of MIL-STD-883. Group A and B inspections are
performed on each production lot. Group C and D inspections are performed on a periodic basis.
All static and dynamic electrical characteristics specified for inspection purposes and the relevant mea-
surement conditions are given below:
For static characteristics
existing.
For dynamic characteristics
specification.
JC
• e2v logo
• Manufacturer’s part number
• Class B identification
• Date-code of inspection lot
• ESD identifier if available
• Country of manufacturing
•
•
Table
Table
is device related and cannot be influenced by the user. However,
JA
=
7-1,
7-3,
JC
+
Table
Table
CA
7-2: Static electrical characteristics for the electrical variants.
7-4,
JC
Table
(Table
. Substitution of
(Table
7-5: Dynamic electrical characteristics.
7-1,
7-3,
Table
Table
7-2), test methods refer to IEC 748-2 method number, where
JC
for
7-4,
JA
Table
in equation (1) will result in a lower semiconductor
(4)
7-5), test methods refer to clause 5.5 of this
CA
is user dependent and can be
e2v semiconductors SAS 2008
TS68C429A
CA
so that
JA