5962-8868907QA QP SEMICONDUCTOR, 5962-8868907QA Datasheet - Page 25

• Manufacturer Part Number: 5962-8868907QA
• Manufacturer: QP SEMICONDUCTOR

Specifications of 5962-8868907QA

• Lead Free Status / Rohs Status: Not Compliant

DSCC FORM 2234
APR 97
appendix A.
prior to quality conformance inspection. The following additional criteria shall apply:
MIL-STD-883 including groups A, B, C, and D inspections. The following additional criteria shall apply.
4. QUALITY ASSURANCE PROVISIONS
4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535,
4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices
b.
4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of
4.3.1 Group A inspection.
a.
a.
b.
c.
d.
(1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision
(2) T
Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter
tests prior to burn-in are optional at the discretion of the manufacturer.
DEFENSE SUPPLY CENTER COLUMBUS
Burn-in test, method 1015 of MIL-STD-883.
Tests shall be as specified in table II herein.
Subgroups 5 and 6 in table I, method 5005 of MIL-STD-883 shall be omitted.
Subgroup 4 (C
changes which may affect input capacitance. A minimum sample size of five devices with zero rejects is required.
Subgroups 7 and 8 shall verify the functionality of the device.
level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in
test method 1015 of MIL-STD-883.
A
MICROCIRCUIT DRAWING
= +125 C, minimum.
COLUMBUS, OHIO 43216-5000
STANDARD
IN
, C
OUT
* PDA applies to subgroup 1.
Interim electrical parameters
Final electrical test parameters
Group A test requirements
Groups C and D end-point
MIL-STD-883 test requirements
, and C
(method 5004)
(method 5004)
(method 5005)
electrical parameters
(method 5005)
I/O
measurements) shall be measured only for the initial test and after process or design
TABLE II. Electrical test requirements.
1*, 2, 3, 7, 9, 10, 11
1, 2, 3, 4, 7, 8, 9, 10, 11
MIL-STD-883, method 5005,
SIZE
A
(in accordance with
Subgroups
table I)
1, 2, 3
----
REVISION LEVEL
C
SHEET
5962-88689
25