LH28F320S5HNS-ZP Sharp Electronics, LH28F320S5HNS-ZP Datasheet - Page 37

• Manufacturer Part Number: LH28F320S5HNS-ZP
• Manufacturer: Sharp Electronics

Specifications of LH28F320S5HNS-ZP

• Cell Type: NOR
• Density: 32Mb
• Access Time (max): 100ns
• Interface Type: Parallel
• Boot Type: Not Required
• Address Bus: 22/21Bit
• Operating Supply Voltage (typ): 5V
• Operating Temp Range: -40C to 85C
• Package Type: SSOP
• Program/erase Volt (typ): 4.5 to 5.5V
• Sync/async: Asynchronous
• Operating Temperature Classification: Industrial
• Operating Supply Voltage (min): 4.5V
• Operating Supply Voltage (max): 5.5V
• Word Size: 8/16Bit
• Number Of Words: 4M/2M
• Supply Current: 75mA
• Mounting: Surface Mount
• Pin Count: 56
• Lead Free Status / Rohs Status: Compliant

6.2.2 AC INPUT/OUTPUT TEST CONDITIONS
Figure 16. Transient Equivalent Testing
DEVICE
UNDER
TEST
Input rise and fall times (10% to 90%) <10 ns.
(2.0 V
AC test inputs are driven at 3.0V for a Logic "1" and 0.0V for a Logic "0." Input timing begins, and output timing ends, at 1.5V.
AC test inputs are driven at V
0.45
3.0
0.0
2.4
C
TTL
L
Capacitance
Includes Jig
Figure 14. Transient Input/Output Reference Waveform for V
) and V
Figure 15. Transient Input/Output Reference Waveform for V
Load Circuit
IL
INPUT
INPUT
(0.8 V
1.3V
TTL
R
). Output timing ends at V
C
L
1N914
=3.3kΩ
OH
L
(2.4 V
1.5
(High Speed Testing Configuration)
(Standard Testing Configuration)
0.8
2.0
TTL
OUT
) for a Logic "1" and V
LHF32KZP
IH
and V
TEST POINTS
TEST POINTS
IL
. Input rise and fall times (10% to 90%) <10 ns.
OL
(0.45 V
Test Configuration Capacitance Loading Value
V
V
CC
CC
TTL
Test Configuration
=5V±0.25V
=5V±0.5V
) for a Logic "0." Input timing begins at V
CC
CC
=5V±0.25V
=5V±0.5V
1.5
2.0
0.8
OUTPUT
OUTPUT
C
L
100
30
IH
(pF)
Rev. 1.6
34