LH28F800BJHE-PBTLT9 Sharp Microelectronics, LH28F800BJHE-PBTLT9 Datasheet - Page 33

• Manufacturer Part Number: LH28F800BJHE-PBTLT9
• Description: Flash Mem Parallel 3V/3.3V 8M-Bit 1M x 8 90ns 48-Pin TSOP
• Manufacturer: Sharp Microelectronics

Specifications of LH28F800BJHE-PBTLT9

• Package: 48TSOP
• Cell Type: NOR
• Density: 8 Mb
• Architecture: Sectored
• Block Organization: Asymmetrical
• Location Of Boot Block: Bottom
• Typical Operating Supply Voltage: 3|3.3 V
• Sector Size: 8KByte x 8|64KByte x 15
• Timing Type: Asynchronous
• Operating Temperature: -40 to 85 °C
• Interface Type: Parallel

6.2.2 AC Input/Output Test Conditions
Figure 15. Transient Equivalent Testing Load Circuit
DEVICE
UNDER
TEST
AC test inputs are driven at 2.7V for a Logic "1" and 0.0V for a Logic "0". Input timing begins, and output timing ends, at 1.35V.
Input rise and fall times (10% to 90%) <10 ns.
2.7
0.0
C
L
Capacitance
Includes Jig
Figure 14. Transient Input/Output Reference Waveform for V
INPUT
1.3V
R
C
1N914
L
L
=3.3kΩ
1.35
OUT
TEST POINTS
V
CC
Test Configuration Capacitance Loading Value
=2.7V-3.6V
Test Configuration
CC
=2.7V-3.6V
1.35
OUTPUT
C
L
50
(pF)
Rev. 1.27