P80C557E4EFB/01,51 NXP Semiconductors, P80C557E4EFB/01,51 Datasheet - Page 67

• Manufacturer Part Number: P80C557E4EFB/01,51
• Description: IC 80C51 MCU 1024 ROMLESS 80QFP
• Manufacturer: NXP Semiconductors
• Series: 80Cr

Specifications of P80C557E4EFB/01,51

• Core Processor: 8051
• Core Size: 8-Bit
• Speed: 16MHz
• Connectivity: EBI/EMI, I²C, UART/USART
• Peripherals: POR, PWM, WDT
• Number Of I /o: 40
• Program Memory Size: -
• Program Memory Type: ROMless
• Eeprom Size: -
• Ram Size: 1K x 8
• Voltage - Supply (vcc/vdd): 4.5 V ~ 5.5 V
• Data Converters: A/D 8x10b
• Oscillator Type: External
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 80-BQFP
• Lead Free Status / Rohs Status: Lead free / RoHS Compliant

Philips Semiconductors
1999 Mar 02
NOTE:
AC inputs during testing are driven at 2.4V for a logic ‘HIGH’ and 0.45V for a logic
‘LOW’. Timing measurements are made at 2.0 V for a logic ‘HIGH’ and 0.8 V for a
logic ‘LOW’.
Single-chip 8-bit microcontroller
0.45 V
2.4 V
PORT 0
PORT 2
PSEN
ALE
Figure 58. AC Testing Input/Output
2.0 V
0.8 V
Test Points
t
LHLL
t
AVLL
V
IH1
A0–A7
Figure 60. External Program Memory Read Cycle
t
2.0 V
0.8 V
CLKH
Figure 57. External Clock Drive waveform
t
t
LLAX
LLPL
t
AVIV
V
IH1
t
LLIV
0.8V
A8–A15
t
PLAZ
t
t
t
CLKL
t
PLIV
PXIX
PLPH
t
CLKR
INSTR IN
67
P83C557E4/P80C557E4/P89C557E4
NOTE:
The float state is defined as the point at which a port 0 pins sinks 3.2 mA or
t
sources 400 A at the voltage test levels.
CLK
0.45 V
0.8V
t
2.4 V
PXIZ
V
IH1
Figure 59. AC Testing, Float Waveform
V
IH1
2.0 V
0.8 V
A0–A7
t
CLKF
Float
A8–A15
2.0 V
0.8 V
Product specification
2.4 V
0.45 V