ST72521R9-Auto STMicroelectronics, ST72521R9-Auto Datasheet - Page 231

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ST72521R9-Auto

Manufacturer Part Number
ST72521R9-Auto
Description
8-bit MCU for automotive
Manufacturer
STMicroelectronics
Datasheet

Specifications of ST72521R9-Auto

Hdflash Endurance
100 cycles, data retention 20 years
Clock Sources
crystal/ceramic resonator oscillators, internal RC oscillator and bypass for external clock
4 Power Saving Modes
Halt, Active Halt, Wait and Slow
ST72521xx-Auto
20.5.5
PLL characteristics
Table 139. PLL characteristics
1. Data based on characterization results
The user must take the PLL jitter into account in the application (for example, in serial
communication or sampling of high frequency signals). The PLL jitter is a periodic effect,
which is integrated over several CPU cycles. Therefore, the longer the period of the
application signal, the less it is impacted by the PLL jitter.
Figure 96
4 MHz. At frequencies of less than 125 kHz, the jitter is negligible.
Figure 96. Integrated PLL jitter versus signal frequency
1. Measurement conditions: f
 f
Symbol
CPU
f
OSC
/f
CPU
shows the PLL jitter integrated on application signals in the range 125 kHz to
PLL input frequency range
Instantaneous PLL jitter
+/-Jitter (%)
CPU
1.2
0.8
0.6
0.4
0.2
1
0
Parameter
= 8 MHz
4 MHz
Doc ID 17660 Rev 1
2 MHz
(1)
Application Frequency
1 MHz 500 kHz 250 kHz 125 kHz
ROM device,
f
Flash device,
f
Flash device,
f
OSC
OSC
OSC
Conditions
= 4 MHz
= 4 MHz
= 2 MHz
FLASH typ
ROM max
ROM typ
(1)
Electrical characteristics
Min
2
Typ
0.7
1.0
2.5
Max
2.5
4.0
4
2
231/276
MHz
Unit
%

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