CS6150 Amphion Semiconductor Ltd., CS6150 Datasheet - Page 4

• Manufacturer Part Number: CS6150
• Description: Motion JPEG Decoder
• Manufacturer: Amphion Semiconductor Ltd.

4
Table 1: I/O Signal Description (Continued on page 5)
GLOBAL SIGNALS
JPEG INPUT PORT
DECODING MASKED JPEG OUTPUT PORT
PIXEL OUT PORT
TEST PORT
DecJpgNext
DecJpgAvail
PixOutEnab
PixOutValid
PixOutSob
PixOutLast
DecSoiEoi
JpgInStrb
JpgInRdy
JpgMask
SIGNAL
DecJpg
CS6150
PixOut
TestEn
TType
TSOS
TSOB
TData
TValid
RSTn
JpgIn
CLK
CLR
WIDTH
(BITS)
PORT
11
1
1
1
8
1
1
5
1
8
1
2
8
1
1
1
1
1
1
1
1
1
Output
Output
Output
Output
Output
Output
Output
Output
Output
Output
Output
Output
Output
Input
Input
Input
Input
Input
Input
Input
Input
Input
I/O
M o t i o n J P E G D e c o d e r
Clock
Clock-rising edge active
Reset
Asynchronous reset (power-on-reset)
Clear
Synchronous reset
JPEG Input
JPEG data input port
JPEG Input Strobe
JPEG data input strobe
JPEG Input Ready
Indicates that the CS6150 is ready to accept JPEG input data
JPEG Mask
DecJpg output configuration port
Decoded JPEG Next
Informs core to place next 8-bit word of masked JPEG output data onto DecJpg.
The data is held if DecJpgNext is not asserted.
Decoded JPEG
Masked output JPEG data
Decoded JPEG Available
Indicates that valid data is available on DecJpg
Decoded Start of Image and End of Image
Indicates the start and end of image
Pixel Output
Pixel output data
Pixel Output Start of Block
Marks the first value in each 8x8-output block of pixel data
Pixel Output Valid
Indicates valid pixel output data
Pixel Output Last
Indicates the last block of decoded pixel data of a scan
Pixel Output Enable
Informs core to output 8x8 blocks of pixel data onto PixOut
Test Type
Test type selector
Test Start of Scan
Marks the first value in the first 8x8-output block of test data
Test Start of Block
Marks the first value in each 8x8-output block of test data
Test Data
11-bit output test data port – displays DCT coefficients or quantized coefficients
Test Data Valid
Indicates valid test data output
Test Enable
Causes memories to be bypassed for test purposes
DESCRIPTION