AD5560 Analog Devices, Inc., AD5560 Datasheet - Page 10

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AD5560

Manufacturer Part Number
AD5560
Description
1.2 A Programmable Device Power Supply With Integrated 16-bit Level Setting Dacs
Manufacturer
Analog Devices, Inc.
Datasheet

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AD5560
Parameter
REFERENCE INPUT
COMPARATOR
VOLTAGE COMPARATOR
CURRENT COMPARATOR
MEASURE OUTPUT, MEASOUT
OPEN-SENSE DETECT/CLAMP/ALARM
DUTGND
GUARD AMPLIFIER
DIE TEMPERATURE SENSOR
SPI INTERFACE LOGIC
VREF DC Input Impedance
VREF Input Current
VREF Range
Error
Propagation Delay
Error
Propagation Delay
Error
Measure Output Voltage Span
Measure Output Voltage Span
Measure Output Voltage Span
Measure Output Voltage Span
Measure Pin Output Impedance
Output Leakage Current
Output Capacitance
Short-Circuit Current
Measurement Accuracy
Clamp Accuracy
Alarm Delay
Voltage Range
Pull-Up Current
Leakage Current
Trip Point Accuracy
Alarm Delay
Voltage Range
Voltage Span
Output Offset
Short-Circuit Current
Load Capacitance
Output Impedance
Alarm Delay
Accuracy
Output Voltage at 25°C
Output Scale Factor
Output Voltage Range
Logic Inputs
Input High Voltage, V
Input Low Voltage, V
Slew Rate
Digital-to-Analog Glitch Energy
Glitch Impulse Peak Amplitude
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
IL
IH
1
1
1
1
1
1
1
Min
1
−10
2
−7
−12
−1.5
−12.81
−6.405
0
0
−100
−10
−200
−1
−1
−30
AV
−10
−20
−10
1
1.7/2.0
SS
+ 2.25
Typ
1
10
40
0.25
0.25
5
600
50
+50
50
100
200
1.54
4.7
Rev. B | Page 10 of 60
Max
+10
5
+7
+12
1
+1.5
+12.81
+6.405
5.125
2.56
115
+100
+10
+200
900
+1
+70
+1
+10
AV
25
+10
+20
100
+10
2
0.7/0.8
DD
− 2.25
Unit
V/μs
nV-s
mV
μA
V
mV
μs
mV
μs
%
V
V
V
V
Ω
nA
pF
mA
mV
mV
μs
V
μA
μA
mV
μs
V
V
mV
mA
nF
Ω
μs
%
V
mV/°C
V
V
V
Test Conditions/Comments
Typically 100 MΩ.
Per input; typically ±30 nA.
Measured directly at comparator; does not
include measure block errors.
Uncalibrated.
With respect to the measured voltage.
Uncalibrated.
Of programmed current range, uncalibrated.
MEASOUT gain = 1, V
0x8000.
MEASOUT gain = 1, V
MEASOUT gain = 0.2, V
0x8000.
MEASOUT gain = 0.2, V
When HW_INH is low.
Pull-up for purpose of detecting open circuit
on DUTGND, can be disabled.
When pull-up disabled, DGS DAC = 0x3333
(1 V with V
away from one of comparator thresholds,
more leakage may be present.
If it moves 100 mV away from input level.
Relative to a temperature change.
(2.3 V to 2.7 V)/(2.7 V to 5.5 V) JEDEC-compliant
input levels.
(2.3 V to 2.7 V)/(2.7 V to 5.5 V) JEDEC-compliant
input levels.
REF
= 5 V). If DUTGND voltage is far
REF
REF
REF
REF
= 5 V, offset DAC =
= 2.5 V.
= 5 V, offset DAC =
= 2.5 V.

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