MBM29LV320TE Fujitsu Microelectronics, Inc., MBM29LV320TE Datasheet - Page 38

• Manufacturer Part Number: MBM29LV320TE
• Description: 32 M 4 M X 8/2 M X 16 Bit
• Manufacturer: Fujitsu Microelectronics, Inc.

38
MBM29LV320TE/BE
* : Test Conditions :
Read Cycle Time
Address to Output Delay
Chip Enable to Output Delay
Output Enable to Output Delay
Chip Enable to Output High-Z
Output Enable to Output High-Z
Output Hold Time From Addresses,
CE or OE, Whichever Occurs First
RESET Pin Low to Read Mode
CE to BYTE Switching Low or High
AC CHARACTERISTICS
• Read Only Operations Characteristics
Output Load : 1 TTL gate and 30 pF (MBM29LV320TE80, MBM29LV320BE80)
Input rise and fall times : 5 ns
Input pulse levels : 0.0 V or 3.0 V
Timing measurement reference level
Notes : C
Input : 1.5 V
Output : 1.5 V
C
L
L
Parameter
30 pF including jig capacitance (MBM29LV320TE80, MBM29LV320BE80)
100 pF including jig capacitance (MBM29LV320TE90/10, MBM29LV320BE90/10)
Device
Under
Test
100 pF (MBM29LV320TE90/10, MBM29LV320BE90/10)
JEDEC Standard
C
t
t
t
t
t
t
t
L
AVQV
GLQV
EHQZ
GHQZ
AXQX
ELQV
AVAV
Symbol
80/90/10
Test Conditions
t
t
READY
t
t
ELFH
t
t
t
ELFL
t
t
t
ACC
OH
RC
CE
OE
DF
DF
IN3064
or Equivalent
6.2 k
CE
OE
OE
Condi-
tion
V
V
V
3.3 V
IL
IL
IL
2.7 k
Min
80
0
80*
Diodes
or Equivalent
Max
80
80
30
25
25
20
5
Min
90
IN3064
0
Value
90*
Max Min Max
90
90
35
30
30
20
5
100
0
10*
100
100
35
30
30
20
5
Unit
ns
ns
ns
ns
ns
ns
ns
ns
s