TS68040 ATMEL Corporation, TS68040 Datasheet - Page 8

• Manufacturer Part Number: TS68040
• Description: 32-bit Mpu, 25-33 MHZ
• Manufacturer: ATMEL Corporation

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Table 3 - Signal index (Continued)
B - DETAILED SPECIFICATIONS
1 - SCOPE
This drawing describes the specific requirements for the microprocessor TS 68040 - 25 MHz and 33 MHz, in compliance
with MIL-STD-883 class B or TCS standard screening.
2 - APPLICABLE DOCUMENTS
MIL-STD-883
1) MIL-STD-883 : test methods and procedures for electronics.
2) MIL-I-38535 : general specifications for microcircuits.
3) DESC 5962-93143.
3 - REQUIREMENTS
3.1 - General
The microcircuits are in accordance with the applicable document and as specified herein.
3.2 - Design and construction
3.2.1 - Terminal connections
Depending on the package, the terminal connections shall be is shown in Figures 2 and 3 (§ A).
3.2.2 - Lead material and finish
Lead material and finish shall be as specified in MIL-STD-853 (see enclosed § 10).
3.2.3 - Package
The macrocircuits are packaged in hermetically sealed ceramic packages which are conform to case outlines of MIL-STD-
1835-or as follow :
– CMGA 10-179-PAK pin grid array, but see § 9.1.
– similar to CQCC1-F196C-U6 ceramic uniform lead chip carrier package with ceramic non conductiv tie-bar but use our
internal drawing see § 9.2,
– gullwing shape CQFP see § 9.3.
The precise case outlines are described at the end of the specification (§ 9) and into MIL-STD-1835.
3.3 - Electrical characteristics
3.3.1 - Absolute maximum ratings
Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maxi-
mum levels may degrade performance and affect reliability.
Processor clock
Test clock
Test mode select
Test data input
Test data output
Test reset
Power supply
Ground
Signal Name
Mnemonic
PCLK
TRST
GND
TMS
TDO
V CC
TCK
TDI
Clock input used for internal logic timing. The PCLK frequency is
exactly 2X the BCLK frequency
Clock signal for the IEEE P1149.1 test access port (TAP)
Selects the principle operations of the test-support circuitry
Serial data input for the TAP
Serial data output for the TAP
Provides an asynchronous reset of the TAP controller
Power supply
Ground connection
Function