MAC7100CVF Motorola, MAC7100CVF Datasheet - Page 4

• Manufacturer Part Number: MAC7100CVF
• Description: MAC7100 Microcontroller Family Hardware Specifications
• Manufacturer: Motorola

Electrical Characteristics
1
2
3
4
5
3.3
All ESD testing is in conformity with CDF-AEC-Q100 Stress test qualification for Automotive Grade
Integrated Circuits. During the device qualification ESD stresses were performed for the Human Body
Model (HBM), the Machine Model (MM) and the Charge Device Model.
A device is defined as a failure if after exposure to ESD pulses the device no longer meets the device
specification. Complete DC parametric and functional testing is performed per the applicable device
specification at room temperature followed by hot temperature, unless specified otherwise.
4
Human Body
Machine
Latch-up
Num
A12
A13
A14
A15
A16
A17
A11
The device contains an internal voltage regulator to generate the logic and PLL supply from the I/O supply. The
absolute maximum ratings apply when the device is powered from an external source.
Input must be current limited to the value specified. To determine the value of the required current-limiting resistor,
calculate resistance values using V
calculated values.
These pins are internally clamped to V
All I/O pins are internally clamped to V
This pin is clamped low to V
Model
XFC, EXTAL, XTAL inputs
TEST input
Instantaneous Maximum Current
Storage Temperature Range
ESD Protection and Latch-up Immunity
Single pin limit for XFC, EXTAL, XTAL
Single pin limit for all digital I/O pins
Single pin limit for all analog input pins
Single pin limit for TEST
Series Resistance
Storage Capacitance
Number of Pulses per pin
Series Resistance
Storage Capacitance
Number of Pulse per pin
Minimum input voltage limit
Maximum input voltage limit
positive
negative
positive
negative
PRELIMINARY—SUBJECT TO CHANGE WITHOUT NOTICE
MAC7100 Microcontroller Family Hardware Specifications
Table 3. Absolute Maximum Ratings (continued)
Freescale Semiconductor, Inc.
SS
X, but not clamped high, and must be tied low in applications.
Table 4. ESD and Latch-up Test Conditions
For More Information On This Product,
Rating
5
POSCLAMP
SS
SS
Description
2
X and V
PLL and V
Go to: www.freescale.com
4
= V
3
4
DD
DD
DD
X, V
A + 0.3 V and V
PLL.
SS
R and V
Symbol
DD
V
NEGCLAMP
V
T
TEST
I
I
I
R or V
I
DL
DA
DT
ILV
stg
D
SS
A and V
= –0.3 V, then use the larger of the
Symbol
–0.25
R1
R1
—
—
–0.3
–0.3
C
C
Min
–25
–25
–25
–65
DD
A.
Value
1500
–2.5
+10.0
100
200
+155
7.5
Max
+3.0
+25
+25
+25
—
—
3
3
0
3
3
0
MOTOROLA
Ohm
Ohm
Unit
Unit
mA
mA
mA
mA
pF
pF
°C
V
V
V
V