CA3127 Intersil, CA3127 Datasheet - Page 3

• Manufacturer Part Number: CA3127
• Description: High Frequency NPN Transistor Array
• Manufacturer: Intersil

Test Circuits
V
I
1000pF
HEWLETT PACKARD HP343A
OHMITE
Z144
VHF NOISE SOURCE
0.3 H
1.8pF
(NOTE 5)
8
C
1000
pF
SHIELD
1
FIGURE 1. VOLTAGE-GAIN TEST CIRCUIT USING CURRENT-MIRROR BIASING FOR Q
FIGURE 3. BLOCK DIAGRAMS OF POWER-GAIN AND NOISE-FIGURE TEST SET-UPS
4
GENERAL RADIO 1021-P1
100MHz GENERATOR
3
6
7
2
Q
Q
FIGURE 2. 100MHz POWER-GAIN AND NOISE-FIGURE TEST CIRCUIT
2
3
Q
12
5
5
13
620
25k
1 F
(NOTE 5)
POWER SUPPLY
1000
0.01
14
F
pF
560
TEST SET
10k
FIGURE 3B. NOISE FIGURE SET-UP
100MHz
C
FIGURE 3A. POWER GAIN SET-UP
12V
8
2
BIAS-CURRENT
ADJ
470pF
DC
ATTN
6
7
Q
8.2
k
3
1000
1000
CA3127
750
1%
pF
pF
V+
1.5 - 8pF
0.01 F
0.47 H
5-3
470pF
51
V
POWER SUPPLY
TEST
POINT
+12V
I
TEST SET
GEN
POST AMPLIFIER
POWER SUPPLY
100MHz
4
12V
R
NOTES:
100MHz
L
DC
15V
4. This circuit was chosen because it conveniently repre-
5. E.F. Johnson number 160-104-1 or equivalent.
V
2
3
O
Q
sents a close approximation in performance to a proper-
ly unilateralized single transistor of this type. The use of
Q
biasing. The use of the cascode circuit in no way implies
that the transistors cannot be used individually.
DC
2
3
in a current-mirror configuration facilitates simplified
470
pF
V
O
0.01
F
RF VOLTMETER
BOONTON 91C
1 F
HEWLETT PACKARD HP342A
NOISE FIGURE METER
2