SGA-8343X Stanford Microdevices, SGA-8343X Datasheet - Page 4

• Manufacturer Part Number: SGA-8343X
• Description: Reliability Qualification Report
• Manufacturer: Stanford Microdevices

Table 1: Summary of High Temperature Operational Life Test Cumulative Device Hours
VIIII. Electrostatic Discharge Classification
Sirenza Microdevices classifies Human Body Model (HBM) electrostatic discharge (ESD)
according to the JESD22-A114 convention. All pin pair combinations were tested. Each
pin pair is stressed at one static voltage level using 1 positive and 1 negative pulse
polarity to determine the weakest pin pair combination. The weakest pin pair is tested
with 3 devices below and above the failure voltage to classify the part. The Pass/Fail
status of a part is determined by the manufacturing test specification. The ESD class
quoted indicates that the device passed exposure to a certain voltage, but does not pass
the next higher level. The following table indicates the JESD ESD sensitivity
classification levels. The results of the testing indicate that SGA-8343X’s HBM ESD
rating is Class 1B.
X. Operational Life Test Results
The results for SGA-8343X High Temperature Operating Life Test are as
XI. Qualification Test Results for SGA-8343X
Initial Qualification Date – March, 2004
Test Conditions
Number of
Devices Under
Test
HTOL Completion
Group A0
Class
1A
1B
1C
0
2
Mar-04
Date
SGA-8343X Reliability Qualification Report
Passes
1000 V
2000 V
250 V
500 V
0 V
Moisture preconditioning and three reflow cycles
Temperature = 270°C Peak, Slope < 6°C/second
145
Duration
hours
1000
Test
Test
Standard
<250 V
1000 V
2000 V
4000 V
500 V
Fails
Temperature
Junction
150°C
JESD22-
A113(C)
Quantity
80
Results
follows:
Device Hours
80,000
PASS