SGA-8343X Stanford Microdevices, SGA-8343X Datasheet - Page 7

• Manufacturer Part Number: SGA-8343X
• Description: Reliability Qualification Report
• Manufacturer: Stanford Microdevices

Test Conditions
Number of
Devices Under
Test
Test Conditions
Number of
Devices Under
Test
Group J
Group K
(1)
1 device removed for improper assembly. See CAR number 350; Reference FA04032.
SGA-8343X Reliability Qualification Report
Tin Whiskering Biased
Temperature 51°C/85% humidity. Test Duration 1000 hours.
15
Tin Whiskering Unbiased
Temperature 51°C/85% humidity. Test Duration 1000 hours.
15
Test
Standard
Test
Standard
SMDI Internal
SMDI Internal
Results
Results
PASS
PASS