SGA-8343X Stanford Microdevices, SGA-8343X Datasheet - Page 8

• Manufacturer Part Number: SGA-8343X
• Description: Reliability Qualification Report
• Manufacturer: Stanford Microdevices

SGA-8343X Reliability Qualification Report
XII. Junction Temperature Determination
One key issue in performing qualification testing is to accurately determine the junction
temperature of the device. Sirenza Microdevices uses a 3um spot size emissivity
corrected infrared camera measurement to resolve the surface temperature of the device
at the maximum operational power dissipation. The results are displayed below for the
device running at operational current of 50mA, a device voltage of 4V, and a lead
temperature of 85°C.
Tj = 112.9°C
Figure 2: Infrared Thermal Image of SGA-8343X, Vd =4V, Id =50 mA, T lead = 85°C