mpc5602d Freescale Semiconductor, Inc, mpc5602d Datasheet - Page 44

• Manufacturer Part Number: mpc5602d
• Description: Mpc5602d Microcontroller Data Sheet
• Manufacturer: Freescale Semiconductor, Inc

Electrical characteristics
4.12.1
EMC characterization and optimization are performed at component level with a typical application environment and simplified
MCU software. It should be noted that good EMC performance is highly dependent on the user application and the software in
particular.
Therefore it is recommended that the user apply EMC software optimization and prequalification tests in relation with the EMC
level requested for his application.
4.12.2
The product is monitored in terms of emission based on a typical application. This emission test conforms to the IEC 61967-1
standard, which specifies the general conditions for EMI measurements.
4.12.3
Based on two different tests (ESD and LU) using specific measurement methods, the product is stressed in order to determine
its performance in terms of electrical sensitivity.
4.12.3.1
Electrostatic discharges (a positive then a negative pulse separated by 1 second) are applied to the pins of each sample according
to each pin combination. The sample size depends on the number of supply pins in the device (3 parts * (n + 1) supply pin).
This test conforms to the AEC-Q100-002/-003/-011 standard.
44
•
•
1
2
3
V
f
S
Symbol C
DD_LV
CPU
EMI testing and I/O port waveforms per IEC 61967-1, -2, -4
For information on conducted emission and susceptibility measurement (norm IEC 61967-4), please contact your
local marketing representative.
All values need to be confirmed during device validation
—
EMI
Software recommendations The software flowchart must include the management of runaway conditions such as:
— Corrupted program counter
— Unexpected reset
— Critical data corruption (control registers...)
Prequalification trials Most of the common failures (unexpected reset and program counter corruption) can be
reproduced by manually forcing a low state on the reset pin or the oscillator pins for 1 second.
To complete these trials, ESD stress can be applied directly on the device. When unexpected behavior is detected, the
software can be hardened to prevent unrecoverable errors occurring.
CC T Peak level
SR — Scan range
SR — Operating frequency
SR — LV operating voltages
Designing hardened software to avoid noise problems
Electromagnetic interference (EMI)
Absolute maximum ratings (electrical sensitivity)
Electrostatic discharge (ESD)
Parameter
Table 29. EMI radiated emission measurement
Preliminary—Subject to Change Without Notice
MPC5602D Microcontroller Data Sheet, Rev. 3.1
V
100 LQFP package
Test conforming to IEC 61967-2,
f
OSC
DD
= 5 V, T
= 8 MHz/f
A
= 25 °C,
CPU
= 48 MHz
Conditions
—
—
—
No PLL frequency
modulation
± 2% PLL frequency
modulation
1,2
0.150
Min
—
—
—
—
Freescale Semiconductor
Value
1.28
Typ
48
—
—
—
TBD
1000 MHz
Max
TBD dBµV
—
—
3
dBµV
Unit
MHz
V