lu82562ex Intel Corporation, lu82562ex Datasheet - Page 62

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lu82562ex

Manufacturer Part Number
lu82562ex
Description
Dual Footprint
Manufacturer
Intel Corporation
Datasheet
82562EZ(EX)/82547GI(EI) Dual Footprint Design Guide
A.5
54
Example 2.
Note: The following items should be noted for an ideal reference crystal on a typical printed circuit
Note: Direct probing is not recommended for the 82547GI(EI) LAN silicon.
board.
Direct Probing Test Method, Applicable for Most 10/100
Devices (Devices that do NOT support 1000Base-T)
Because probe capacitance can load the reference crystal affecting the measured frequency, it is
preferable to use a probe with less than 1 pF capacitance.
The probe should be connected between the X2 (or Xout) pin of the LAN device and a nearby
ground. Typically, it is possible to connect the probe pins across one of the discrete load capacitors
(C2 in
Given: The measured averaged center frequency is 125.00087 MHz (or 125,000,870 Hertz).
If the transmitter reference frequency is more than 8 ppm below the target frequency, then the
values for C1 and C2 are too big and they should be decreased. When tests are performed
across temperature, it may be acceptable for the center frequency deviation to be a little greater
than 8 ppm.
If the transmitter reference frequency is more than 8 ppm above the target frequency, then the
values for C1 and C2 are too small and they should be increased. When tests are performed
across temperature, it may be acceptable for the center frequency deviation to be a little greater
than 8 ppm.
FrequencyAccuracy ppm
Figure
12).
(
)
=
(
----------------------------------------------------------------
125000870 125000000
(
125000000 1000000
)
)
=
6.96ppm

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