74aup2g79gt NXP Semiconductors, 74aup2g79gt Datasheet

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74aup2g79gt

Manufacturer Part Number
74aup2g79gt
Description
74aup2g79 Low-power Dual D-type Flip-flop; Positive-edge Trigger
Manufacturer
NXP Semiconductors
Datasheet
1. General description
2. Features
The 74AUP2G79 is a high-performance, low-power, low-voltage, Si-gate CMOS device,
superior to most advanced CMOS compatible TTL families.
Schmitt trigger action at all inputs makes the circuit tolerant to slower input rise and fall
times across the entire V
This device ensures a very low static and dynamic power consumption across the entire
V
This device is fully specified for partial Power-down applications using I
The I
the device when it is powered down.
The 74AUP2G79 provides the dual positive-edge triggered D-type flip-flop. Information on
the data input (nD) is transferred to the nQ output on the LOW-to-HIGH transition of the
clock pulse (nCP). The nD input must be stable one set-up time prior to the LOW-to-HIGH
clock transition for predictable operation.
I
I
I
I
I
I
I
I
I
I
I
CC
74AUP2G79
Low-power dual D-type flip-flop; positive-edge trigger
Rev. 01 — 6 October 2006
Wide supply voltage range from 0.8 V to 3.6 V
High noise immunity
Complies with JEDEC standards:
ESD protection:
Low static power consumption; I
Latch-up performance exceeds 100 mA per JESD 78 Class II
Inputs accept voltages up to 3.6 V
Low noise overshoot and undershoot < 10 % of V
I
Multiple package options
Specified from 40 C to +85 C and 40 C to +125 C
OFF
N
N
N
N
N
N
N
N
range from 0.8 V to 3.6 V.
OFF
JESD8-12 (0.8 V to 1.3 V)
JESD8-11 (0.9 V to 1.65 V)
JESD8-7 (1.2 V to 1.95 V)
JESD8-5 (1.8 V to 2.7 V)
JESD8-B (2.7 V to 3.6 V)
HBM JESD22-A114-D Class 3A exceeds 5000 V
MM JESD22-A115-A exceeds 200 V
CDM JESD22-C101-C exceeds 1000 V
circuitry provides partial Power-down mode operation
circuitry disables the output, preventing the damaging backflow current through
CC
range from 0.8 V to 3.6 V.
CC
= 0.9 A (maximum)
CC
Product data sheet
OFF
.

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74aup2g79gt Summary of contents

Page 1

Low-power dual D-type flip-flop; positive-edge trigger Rev. 01 — 6 October 2006 1. General description The 74AUP2G79 is a high-performance, low-power, low-voltage, Si-gate CMOS device, superior to most advanced CMOS compatible TTL families. Schmitt trigger action at all inputs ...

Page 2

... Ordering information Type number Package Temperature range Name 74AUP2G79DC +125 C 74AUP2G79GT +125 C 74AUP2G79GM +125 C 4. Marking Table 2. Marking Type number 74AUP2G79DC 74AUP2G79GT 74AUP2G79GM 5. Functional diagram 1D 2 1CP 2CP 5 001aaf266 Fig 1. Logic symbol CP D Fig 3. Logic diagram (one flip-flop) ...

Page 3

... NXP Semiconductors 6. Pinning information 6.1 Pinning Fig 4. Pin configuration SOT765-1 (VSSOP8) 74AUP2G79 1CP GND 4 Transparent top view Fig 5. Pin configuration SOT833-1 (XSON8) 6.2 Pin description Table 3. Pin description Symbol Pin SOT765-1/SOT833-1 1CP GND 4 2CP ...

Page 4

... NXP Semiconductors 7. Functional description [1] Table 4. Function table Input nCP L [ HIGH voltage level LOW voltage level; = LOW-to-HIGH CP transition don’t care lower case letter indicates the state of referenced input, one set-up time prior to the LOW-to-HIGH CP transition. 8. Limiting values Table 5. ...

Page 5

... NXP Semiconductors 10. Static characteristics Table 7. Static characteristics At recommended operating conditions; voltages are referenced to GND (ground = 0 V). Symbol Parameter amb V HIGH-level input voltage IH V LOW-level input voltage IL V HIGH-level output voltage OH V LOW-level output voltage OL I input leakage current I I power-off leakage current ...

Page 6

... NXP Semiconductors Table 7. Static characteristics At recommended operating conditions; voltages are referenced to GND (ground = 0 V). Symbol Parameter +85 C amb V HIGH-level input voltage IH V LOW-level input voltage IL V HIGH-level output voltage OH V LOW-level output voltage OL I input leakage current I I power-off leakage current ...

Page 7

... NXP Semiconductors Table 7. Static characteristics At recommended operating conditions; voltages are referenced to GND (ground = 0 V). Symbol Parameter +125 C amb V HIGH-level input voltage IH V LOW-level input voltage IL V HIGH-level output voltage OH V LOW-level output voltage OL I input leakage current I I power-off leakage current ...

Page 8

... NXP Semiconductors 11. Dynamic characteristics Table 8. Dynamic characteristics Voltages are referenced to GND (ground = 0 V); for test circuit see Symbol Parameter Conditions propagation nCP to nQ; see pd delay ...

Page 9

... NXP Semiconductors Table 8. Dynamic characteristics Voltages are referenced to GND (ground = 0 V); for test circuit see Symbol Parameter Conditions propagation nCP to nQ; see pd delay maximum nCP; see ...

Page 10

... NXP Semiconductors Table 8. Dynamic characteristics Voltages are referenced to GND (ground = 0 V); for test circuit see Symbol Parameter Conditions pF and set-up time HIGH nCP; see su Figure 2.7 V ...

Page 11

... NXP Semiconductors Table 8. Dynamic characteristics Voltages are referenced to GND (ground = 0 V); for test circuit see Symbol Parameter Conditions C power MHz dissipation capacitance [1] All typical values are measured at nominal V ...

Page 12

... NXP Semiconductors nD input nCP input nQ output Measurement points are given in Logic levels: V and V are typical output voltage drop that occur with the output load Fig 8. The clock input (nCP) to output (nQ) propagation delays, nCP clock pulse width nCP set-up times, nCP to nD hold times and the nCP maximum frequency Table 9 ...

Page 13

... NXP Semiconductors Test data is given in Table 10. Definitions for test circuit Load resistance Load capacitance including jig and probe capacitance Termination resistance should be equal to the output impedance External voltage for measuring switching times. EXT Fig 9. Load circuitry for switching times Table 10 ...

Page 14

... NXP Semiconductors 13. Package outline VSSOP8: plastic very thin shrink small outline package; 8 leads; body width 2 pin 1 index 1 e DIMENSIONS (mm are the original dimensions UNIT max. 0.15 0. 0.12 0.00 0.60 Notes 1. Plastic or metal protrusions of 0.15 mm maximum per side are not included. ...

Page 15

... NXP Semiconductors XSON8: plastic extremely thin small outline package; no leads; 8 terminals; body 1 x 1. (2) terminal 1 index area DIMENSIONS (mm are the original dimensions) ( UNIT b D max max 0.25 2.0 mm 0.5 0.04 0.17 1.9 Notes 1. Including plating thickness. 2. Can be visible in some manufacturing processes. ...

Page 16

... NXP Semiconductors XQFN8: plastic extremely thin quad flat package; no leads; 8 terminals; body 1.6 x 1.6 x 0.5 mm terminal 1 index area metal area not for soldering 2 1 terminal 1 index area DIMENSIONS (mm are the original dimensions) A UNIT max 0.05 0.25 1.65 mm 0.5 0.00 0.15 1.55 OUTLINE VERSION IEC SOT902 Fig 12 ...

Page 17

... NXP Semiconductors 14. Abbreviations Table 11. Abbreviations Acronym Description CDM Charged Device Model CMOS Complementary Metal Oxide Semiconductor DUT Device Under Test ESD ElectroStatic Discharge HBM Human Body Model MM Machine Model TTL Transistor-Transistor Logic 15. Revision history Table 12. Revision history Document ID Release date 74AUP2G79_1 ...

Page 18

... For detailed and full information see the relevant full data sheet, which is available on request via the local NXP Semiconductors sales office. In case of any inconsistency or conflict with the short data sheet, the full data sheet shall prevail ...

Page 19

... NXP Semiconductors 18. Contents 1 General description . . . . . . . . . . . . . . . . . . . . . . 1 2 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 3 Ordering information . . . . . . . . . . . . . . . . . . . . . 2 4 Marking . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2 5 Functional diagram . . . . . . . . . . . . . . . . . . . . . . 2 6 Pinning information . . . . . . . . . . . . . . . . . . . . . . 3 6.1 Pinning . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3 6.2 Pin description . . . . . . . . . . . . . . . . . . . . . . . . . 3 7 Functional description . . . . . . . . . . . . . . . . . . . 4 8 Limiting values Recommended operating conditions Static characteristics Dynamic characteristics . . . . . . . . . . . . . . . . . . 8 12 Waveforms . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11 13 Package outline . . . . . . . . . . . . . . . . . . . . . . . . 14 14 Abbreviations ...

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