mc9s08ac32 Freescale Semiconductor, Inc, mc9s08ac32 Datasheet - Page 304

• Manufacturer Part Number: mc9s08ac32
• Description: Hcs08 Microcontrollers
• Manufacturer: Freescale Semiconductor, Inc

Appendix A Electrical Characteristics and Timing Specifications
A.3
Absolute maximum ratings are stress ratings only, and functional operation at the maxima is not
guaranteed. Stress beyond the limits specified in
permanent damage to the device. For functional operating conditions, refer to the remaining tables in this
section.
This device contains circuitry protecting against damage due to high static voltage or electrical fields;
however, it is advised that normal precautions be taken to avoid application of any voltages higher than
maximum-rated voltages to this high-impedance circuit. Reliability of operation is enhanced if unused
inputs are tied to an appropriate logic voltage level (for instance, either V
304
Absolute Maximum Ratings
1
2
3
Supply voltage
Input voltage
Instantaneous maximum current
Maximum current into V
Storage temperature
Maximum junction temperature
Input must be current limited to the value specified. To determine the value of the required
current-limiting resistor, calculate resistance values for positive (V
voltages, then use the larger of the two resistance values.
All functional non-supply pins are internally clamped to V
Power supply must maintain regulation within operating V
operating maximum current conditions. If positive injection current (V
I
out of regulation. Ensure external V
current. This will be the greatest risk when the MCU is not consuming power. Examples are: if
no system clock is present, or if the clock rate is very low which would reduce overall power
consumption.
Single pin limit (applies to all port pins)
DD
, the injection current may flow out of V
Rating
DD
Table A-2. Absolute Maximum Ratings
MC9S08AC60 Series Data Sheet, Rev. 2
DD
load will shunt current greater than maximum injection
1
,
2
Table A-2
,
DD
3
and could result in external power supply going
Symbol
may affect device reliability or cause
T
V
V
I
T
I
DD
stg
DD
D
SS
In
J
DD
and V
range during instantaneous and
DD
– 0.3 to V
DD
) and negative (V
– 0.3 to + 5.8
.
– 55 to +150
In
> V
SS
Value
± 25
120
150
DD
or V
DD
) is greater than
+ 0.3
DD
).
Freescale Semiconductor
SS
) clamp
Unit
mA
mA
°C
°C
V
V