SST29EE010-120-3C-E SST [Silicon Storage Technology, Inc], SST29EE010-120-3C-E Datasheet - Page 17

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SST29EE010-120-3C-E

Manufacturer Part Number
SST29EE010-120-3C-E
Description
1 Megabit (128K x 8) Page Mode EEPROM
Manufacturer
SST [Silicon Storage Technology, Inc]
Datasheet
1 Megabit Page Mode EEPROM
SST29EE010, SST29LE010, SST29VE010
© 1998 Silicon Storage Technology, Inc.
AC test inputs are driven at V
points for inputs and outputs are V
ns.
F
F
IGURE
IGURE
TO DUT
13: T
12: AC I
2.4
0.4
EST
NPUT
L
OAD
/O
INPUT
E
UTPUT
XAMPLE
OH
R
EFERENCE
(2.4 V
IH
TEST LOAD EXAMPLE
(2.0 V
C
0.8
TTL
2.0
L
W
) for a logic “1” and V
TTL
AVEFORMS
TO TESTER
) and V
REFERENCE POINTS
IL
(0.8 V
17
TTL
OL
R
). Inputs rise and fall times (10%
L LOW
(0.4 V
TTL
2.0
0.8
) for a logic “0”. Measurement reference
OUTPUT
90%) are <10
R
304 MSW F13.0
V
304 MSW F12.0
CC
L HIGH
304-04 12/97
5
6
7
8
13
14
15
16
1
2
3
4
9
10
11
12

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