SST29EE010-150-4C-EH SST [Silicon Storage Technology, Inc], SST29EE010-150-4C-EH Datasheet - Page 17

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SST29EE010-150-4C-EH

Manufacturer Part Number
SST29EE010-150-4C-EH
Description
1 Mbit (128K x8) Page-Mode EEPROM
Manufacturer
SST [Silicon Storage Technology, Inc]
Datasheet
1 Mbit Page-Mode EEPROM
SST29EE010 / SST29LE010 / SST29VE010
Data Sheet
©2001 Silicon Storage Technology, Inc.
AC test inputs are driven at V
inputs and outputs are V
FIGURE 13: AC I
FIGURE 14: A T
TO DUT
V IHT
V ILT
EST
NPUT
L
INPUT
HT
OAD
/O
(2.0 V) and V
UTPUT
IHT
E
XAMPLE
(2.4V) for a logic “1” and V
R
EFERENCE
TEST LOAD EXAMPLE
C L
LT
V HT
V LT
(0.8 V). Input rise and fall times (10%
TO TESTER
W
AVEFORMS
REFERENCE POINTS
17
ILT
(0.4 V) for a logic “0”. Measurement reference points for
R L LOW
V HT
V LT
90%) are <10 ns.
OUTPUT
Note: V
304 ILL F12.1
V
V
V
LT
IHT
ILT
HT
- V
- V
- V
- V
S71061-07-000 6/01
304 ILL F13.1
V DD
LOW
HIGH
INPUT
INPUT
R L HIGH
Test
Test
LOW Test
HIGH Test
304

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