SST29SF040 SST [Silicon Storage Technology, Inc], SST29SF040 Datasheet - Page 15

• Manufacturer Part Number: SST29SF040
• Description: 4 Mbit (x8) Small-Sector Flash
• Manufacturer: SST [Silicon Storage Technology, Inc]

4 Mbit Small-Sector Flash
SST29SF040 / SST29VF040
©2004 Silicon Storage Technology, Inc.
AC test inputs are driven at V
inputs and outputs are V
AC test inputs are driven at V
for inputs and outputs are V
FIGURE 12: AC I
FIGURE 13: AC I
FIGURE 14: T
TO DUT
V IHT
V IHT
V ILT
V ILT
EST
NPUT
NPUT
L
C L
OAD
INPUT
INPUT
IT
/O
/O
SST29SF040
(1.5 V) and V
TO TESTER
IT
E
UTPUT
UTPUT
IHT
(0.5 V
XAMPLES
IHT
(0.9 V
(3.0 V) for a logic “1” and V
DD
R
R
R L LOW
EFERENCE
EFERENCE
) and V
DD
V IT
V IT
OT
) for a logic “1” and V
(1.5 V). Input rise and fall times (10%
OT
(0.5 V
W
W
AVEFORMS FOR
AVEFORMS FOR
REFERENCE POINTS
REFERENCE POINTS
DD
1160 F14a.0
). Input rise and fall times (10%
V DD
R L HIGH
15
ILT
ILT
(0 V) for a logic “0”. Measurement reference points for
(0.1 V
SST29SF040
SST29VF040
DD
) for a logic “0”. Measurement reference points
TO DUT
V OT
V OT
1160 F14b.0
90%) are <10 ns.
SST29VF040
OUTPUT
OUTPUT
Note: V
90%) are <5 ns.
Note: V
TO TESTER
V
V
V
V
V
V
1160 F12.0
1160 F12.0
OT
IHT
ILT
IT
OT
IHT
ILT
IT
- V
- V
- V
- V
- V
- V
- V
- V
INPUT
INPUT
S71160-10-000
OUTPUT
INPUT
OUTPUT
INPUT
INPUT
INPUT
Test
Test
LOW Test
LOW Test
HIGH Test
HIGH Test
Data Sheet
Test
Test
C L
2/04